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ENICSF2811PBKA 数据表(PDF) 147 Page - Texas Instruments |
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ENICSF2811PBKA 数据表(HTML) 147 Page - Texas Instruments |
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147 / 172 page ![]() Analog Input on Channel Ax or Bx ADC Clock Sample and Hold SH Pulse SMODE Bit t dschx_n t dschx_n+1 Sample n Sample n+1 Sample n+2 t SH ADC Event Trigger from EV or Other Sources t d(SH) TMS320F2810, TMS320F2811, TMS320F2812 TMS320C2810, TMS320C2811, TMS320C2812 www.ti.com SPRS174T – APRIL 2001 – REVISED MAY 2012 6.30.6 Sequential Sampling Mode (Single-Channel) (SMODE = 0) In sequential sampling mode, the ADC can continuously convert input signals on any of the channels (Ax to Bx). The ADC can start conversions on event triggers from the Event Managers (EVA/EVB), software trigger, or from an external ADCSOC signal. If the SMODE bit is 0, the ADC will do conversions on the selected channel on every Sample/Hold pulse. The conversion time and latency of the Result register update are explained below. The ADC interrupt flags are set a few SYSCLKOUT cycles after the Result register update. The selected channels will be sampled at every falling edge of the Sample/Hold pulse. The Sample/Hold pulse width can be programmed to be 1 ADC clock wide (minimum) or 16 ADC clocks wide (maximum). Figure 6-41. Sequential Sampling Mode (Single-Channel) Timing Table 6-48. Sequential Sampling Mode Timing AT 25-MHz SAMPLE n SAMPLE n + 1 ADC CLOCK, REMARKS tc(ADCCLK) = 40 ns Delay time from event td(SH) 2.5tc(ADCCLK) trigger to sampling Sample/ Acqps value = 0–15 tSH Hold width/ (1 + Acqps) * tc(ADCCLK) 40 ns with Acqps = 0 ADCTRL1[8:11] Acquisition width Delay time for first td(schx_n) result to appear in the 4tc(ADCCLK) 160 ns Result register Delay time for successive results to td(schx_n+1) (2 + Acqps) * tc(ADCCLK) 80 ns appear in the Result register Copyright © 2001–2012, Texas Instruments Incorporated Electrical Specifications 147 Submit Documentation Feedback Product Folder Link(s): TMS320F2810 TMS320F2811 TMS320F2812 TMS320C2810 TMS320C2811 TMS320C2812 |
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