STM32L162VC datasheet(99/123 Pages) STMICROELECTRONICS

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STM32L162VC, STM32L162RC

104

dOffset/dT(1)

Offset error temperature

coefficient (code 0x800)

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer OFF

-20

-10

µV/°C

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer ON

020

Gain(1)

Gain error(7)

CL ≤ 50 pF, RL ≥ 5 kΩ

DAC output buffer ON

+0.1 / -0.2% +0.2 / -0.5%

No RL, CL ≤ 50 pF

DAC output buffer OFF

+0 / -0.2%

+0 / -0.4%

dGain/dT(1)

Gain error temperature

coefficient

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer OFF

-10

-2

µV/°C

VDDA = 3.3V

VREF+ = 3.0V

TA = 0 to 50 ° C

DAC output buffer ON

-40

-8

TUE(1)

Total unadjusted error

CL ≤ 50 pF, RL ≥ 5 kΩ

DAC output buffer ON

-12

LSB

No RL, CL ≤ 50 pF

DAC output buffer OFF

-8

tSETTLING

Settling time (full scale:

for a 12-bit code

transition between the

lowest and the highest

input codes till

DAC_OUT reaches final

value ±1LSB

CL ≤ 50 pF, RL ≥ 5 kΩ

µs

Update rate

Max frequency for a

correct DAC_OUT

change (95% of final

value) with 1 LSB

variation in the input

code

CL ≤ 50 pF, RL ≥ 5 kΩ

Msps

tWAKEUP

Wakeup time from off

state (setting the ENx bit

in the DAC Control

CL ≤ 50 pF, RL ≥ 5 kΩ

µs

PSRR+

VDDA supply rejection

ratio (static DC

measurement)

CL ≤ 50 pF, RL ≥ 5 kΩ

-60

-35

1. Data based on characterization results.

2. Connected between DAC_OUT and VSSA.

3. Difference between two consecutive codes - 1 LSB.

Table 59. DAC characteristics (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

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