DA6505.005

11 June 2018

21 (44)

testing purposes. In normal operation the Trim and

The SOSC bit selects between internal and external

oscillator clock signal. By default the internal clock

oscillator is selected (SOSC=0). The external

oscillator signal can be also selected (SOSC=1) but

this is only for testing purpose.

The STEST bits are for selecting test signals to the

SDO pin. In normal operation there is no test output

selected (STEST=0000) which is the default setting.

Other settings (STEST<>0000) select different

signals to the SDO pin and are also only for testing

purpose.

The TRIM bits select source of the trim data. By

default setting (TRIM=00) all trim data is taken from

the EEPROM. This is proper operating mode of a

trimmed pressure module.

TRIM=01 or 10 setting selects Trimming mode which

is used in the trimming of the temperature sensor,

AFE gains and ADC offsets of the temperature and

pressure measurements. In this mode only internal

factory trimmed clock oscillator trim data is taken

from the EEPROM. The rest of the trim data is taken

registers can be done much faster than when using

EEPROM since register write is much faster than the

slower EEPROM write. After finding optimal trim

values to these four trim registers they need to be

stored into the corresponding four EEPROM trim

In normal operating mode (TRIM=00) all the stored

trimming settings will be automatically read to

registers

from

the

EEPROM

memory in

the

beginning of each measurement.

The TRIM=11 setting selects taking all trim data from

registers. This is only for internal clock oscillator

trimming purpose and not needed since the internal

clock oscillator is factory trimmed.

The SCALC bit selects input data source for the IIR

low pass filter. By default SCALC=0 which selects

data from the A/D conversion results. However

SCALC=1 selects to take calculation input data from

instead. This test mode allows testing of the IIR low

pass filter with any 24-bit input data.

Bit

Number

Bit

Name

Description

Value

Function

7

SOSC

Selection for oscillator clock

0

1

Internal clock oscillator (default)

TD = input for external clock signal

6-3

STEST

TEST pin signal selection

0000

0001

0010

0011

0100

0101

0110

0111

1000

1001

1010

1011

1100

1101

1110

1111

SDO = no test output (default)

SDO= output for internal OSC (on all the time)

SDO = output for OUT_SDM

SDO = output for internal band gap

SDO = output for EEPROM VREG voltage

SDO = output for EOC signal

SDO = output for EEPROM VREG OK

SDO = output for EEPROM chip enable

SDO = output for internal LVDD

SDO = PO, TD = NO, AFE output signals

SDO = no test output

SDO = input current sink for external chopper bias

SDO = input for external clock

SDO = input for external clock, internal input short

for sensor bridge noise measurement

SDO = no test output, internal input short for sensor

bridge noise measurement

SDO = no test output, internal temperature diode for

noise measurement

2-1

TRIM

Selects source of trim data

00

01, 10

11

All trim data from EEPROM (default)

Trimming mode (only OSC trim data from EEPROM)

Trim test mode (All trim data from registers)

0

SCALC

Selection for input data source

of IIR filter

0

1

Normal operation (default)

IIR filter test mode

Note: If the SOSC=1 the external clock signal is selected and the internal oscillator is disabled independent of STEST

selection.

Note: External clock signal at either TD or SDO pin must not exceed VDD voltage.