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ADBMS2950BCCSZ 数据表(PDF) 4 Page - Analog Devices |
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ADBMS2950BCCSZ 数据表(HTML) 4 Page - Analog Devices |
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4 / 97 page  ADBMS2950B Data Sheet Rev. 0 | Page 4 of 97 SPECIFICATIONS ELECTRICAL ADC CHARACTERISTICS Operating junction temperature (TJ) = −40°C to +125°C, VDD = 12V, VREG = 5.0V, ISOMD pin is connected low, unless otherwise noted. Table 2. I1ADC and I2ADC Current ADCs Parameter Min Typ Max Unit Test Conditions/Comments OPERATING CONDITIONS Differential Input Range ±130 mV Input-Pin Voltage Range ±130 mV For each IxA, IxB, and SxA pin, referred to the SGND CHARACTERISTICS Update Rate 0.9 1 1.1 kS/s Input Sampling Frequency 3.7 4.1 4.5 MHz ADC Resolution I1ADC 1 μV I2ADC −1 μV Negative input polarity PERFORMANCE Offset Voltage ±1 µV Gain Error ±0.05 ±0.1 % Including solder shift and long-term drift Gain Mismatch ±0.015 ±0.03 % I1ADC gain vs. I2ADC gain Non-Linearity (INL) ±0.06 % Total Measurement Error (TME)1 ±0.2 % Absolute input voltage > 5 mV, ACCN = 32 Conversion Noise 1 ms Conversion Time 1.6 µVRMS Ix registers 8 ms Conversion Time 0.6 µVRMS IxACC registers for ACCN = 8 1 ms × ACCN Conversion Time 1.6 ÷ √ACCN µVRMS IxACC registers depending on ACCN Input Current −3.5 0 +3.5 nA All OCxADCs and IxADCs active. Pin voltage within specified IxADC input-pin voltage range Input Current Mismatch 0.5 nA VIxA = VIxB = VSxA, max of |IIxA − IIxB|, |IIxA − ISxA|, |IIxB − ISxA| DIAGNOSTICS Open-Wire Test Current 0.4 0.5 0.6 µA Input Series Resistance 3.2 3.8 4.4 kΩ Input Series R Mismatch ±1 % Divided VREF1 (VDIV) 118 mV DIAGSEL = 5 Divided VREF2 −125 mV DIAGSEL = 6 1 The TME specifications include the ADC's offset, nonlinearity, drift over temperature (gain error), reflow soldering, lifetime, and thermal hysteresis. Table 3. VB1ADC and VB2ADC Battery Voltage ADCs Parameter Min Typ Max Unit Test Conditions/Comments OPERATING CONDITIONS Differential Input Range −2.6 +2.6 V Input-Pin Voltage Range −0.1 +2.5 V For each VBATx pin, referred to the SGND CHARACTERISTICS Update Rate 0.9 1 1.1 kS/s VBxADC converts in lockstep with IxADC Input Sampling Frequency 3.7 4.1 4.5 MHz Resolution VB1ADC 100 µV VB2ADC −85 µV Negative input polarity PERFORMANCE Offset Voltage 0 ±0.2 mV Gain Error ±0.1 % Including solder shift and long-term drift Gain Mismatch ±0.015 ±0.05 % VB1ADC gain vs.VB2ADC gain Non-Linearity (INL) ±8 LSBs TME1 ±0.2 % Effective ADC input voltage > ±1.0V Conversion Noise 1 ms Conversion Time 0.064 mVRMS VBx registers 8 ms Conversion Time 0.023 mVRMS VBxACC registers for ACCN = 8 1 ms × ACCN Conversion Time 0.064 ÷ √ACCN mVRMS VBxACC registers depending on ACCN Input Current ADC active 0V ≤ VBATx ≤ 2.5V −10 ±1 +10 nA Current into pin, voltage referred to the SGND |
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