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ADBMS2950BCCSZ 数据表(PDF) 5 Page - Analog Devices |
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ADBMS2950BCCSZ 数据表(HTML) 5 Page - Analog Devices |
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5 / 97 page ![]() Data Sheet ADBMS2950B Rev. 0 | Page 5 of 97 Parameter Min Typ Max Unit Test Conditions/Comments −0.1V ≤ VBATx ≤ 0V −50 ±1 +50 nA DIAGNOSTICS Open-Wire Test Current 8 10 12 µA Input Series Resistance 1.84 2.3 2.76 kΩ Divided VREF1 (VDIV) 118 mV DIAGSEL = 5 Divided VREF2 2.375 V DIAGSEL = 6 1 The TME specifications include the ADC's offset, nonlinearity, drift over temperature (gain error), reflow soldering, lifetime, and thermal hysteresis. Table 4. OC1ADC to OC3ADC Overcurrent ADCs Parameter Min Typ Max Unit Test Conditions/Comments OPERATING CONDITIONS Differential Input Range Voltage range over which TME is guaranteed OCxGC = 0 −300 +300 mV OCxGC = 1 −140 +140 mV Input-Pin Voltage Range −315 +315 mV For each IxA and IxB pin, referred to the SGND CHARACTERISTICS Conversion Time (tOCxADC) 56 62.3 69 µs OCxR register update rate Input Sampling Frequency 3.7 4.1 4.5 MHz Resolution OCxGC = 0 5 mV OCxGC = 1 2.5 mV Propagation Delay to OCA, OCB 6.2 µs OCDGT = 0b00, time between OCxR register update and OC output response OCB vs. OCA Phase Shift1 3 ÷ fOSC1 PERFORMANCE Offset Voltage 0 ±2 mV Gain Error ±0.1 ±0.7 % TME2 OCxGC = 0 0 ±7 mV OCxGC = 1 0 ±4.2 mV Conversion Noise ±0.5 mVPEAK Deglitcher-Window Time Inaccuracy ±10 % Guaranteed by design, not subject to test Input Current −100 +100 nA All OCxADC and IxADCs active. Pin voltage within specified OCxADC input-pin voltage range DIAGNOSTICS VTEST,OC,LO Result OCTSEL = 0b10 OCxGC = 0 27 29 LSBs OCxGC = 1 54 58 LSBs VTEST,OC,HI result 57 59 LSBs OCxGC = 0, OCTSEL = 0b11 1 The signal transitions arrive by this amount of time earlier on the OCA pin compared to the OCB pin. 2 The TME specifications include the ADC's offset, nonlinearity, drift over temperature (gain error), reflow soldering, lifetime, and thermal hysteresis. Table 5. V1ADC and V2ADC General Purpose Voltage ADCs Parameter Min Typ Max Unit Test Conditions/Comments OPERATING CONDITIONS Differential Input Range −2.6 +2.6 V Input-Pin Voltage Range −0.1 +2.5 V For each Vx pin, referred to the SGND CHARACTERISTICS Conversion Time 239 265 292 µs Single conversion, no SOAK time Input Sampling Frequency 3.7 4.1 4.5 MHz Resolution V1ADC 100 µV V2ADC −85 µV Negative input polarity PERFORMANCE Offset Voltage ±0.2 mV Gain Error ±0.1 % Including solder shift and long-term drift Gain Mismatch ±0.015 ±0.05 % V1ADC gain vs. V2ADC gain Non-Linearity (INL) ±8 LSBs TME1 ±0.2 % Effective ADC input voltage > ±1.0V Conversion Noise 0.128 mVRMS Input Current ADC active |
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