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RA4E2 数据表(PDF) 24 Page - Renesas Technology Corp |
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RA4E2 数据表(HTML) 24 Page - Renesas Technology Corp |
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24 / 91 page ![]() Ta Average vaAverage value of the tested upper-limit samples during product evaluation. -40 1.40 2.19 25 3.11 7.40 85 10.04 24.53 105 15.28 35.93 125 22.99 52.13 Figure 52.2 Temperature dependency in Software Standby mode (reference data) 0.1 1.0 10.0 100.0 ‐40 ‐20 0 20 40 60 80 100 Ta (℃) Average value of the tested middle samples during product evaluation. Average value of the tested upper‐limit samples during product evaluation. Figure 2.2 Temperature dependency in Software Standby mode (reference data) Ta Average vaAverage value of the tested upper-limit samples during product evaluation. -40 13.47 15.32 25 17.74 25.72 85 42.67 80.72 105 65.61 127.08 125 105.40 202.35 Figure 52.3 Temperature dependency in Deep Software Standby mode, Power supplied to Standby SRAM and USB re 1 10 100 1000 ‐40 ‐20 0 20406080 100 Ta (℃) Average value of the tested middle samples during product evaluation. Average value of the tested upper‐limit samples during product evaluation. Figure 2.3 Temperature dependency in Deep Software Standby mode, power supplied to standby SRAM and USB resume detecting unit (reference data) RA4E2 Datasheet 2. Electrical Characteristics R01DS0413EJ0150 Rev.1.50 May 29, 2026 Page 24 of 91 |
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