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EP1M350 数据表(PDF) 67 Page - Altera Corporation |
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EP1M350 数据表(HTML) 67 Page - Altera Corporation |
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67 / 86 page ![]() Altera Corporation 67 Mercury Programmable Logic Device Family Data Sheet 13 f For more information, see the following documents: ■ Application Note 39 (IEEE Std. 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices) ■ Jam Programming & Test Language Specification Generic Testing Each Mercury device is functionally tested. Complete testing of each configurable static random access memory (SRAM) bit and all logic functionality ensures 100% yield. AC test measurements for Mercury devices are made under conditions equivalent to those shown in Figure 33. Multiple test patterns can be used to configure devices during all stages of the production flow. |
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