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EP1M350 数据表(PDF) 68 Page - Altera Corporation |
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EP1M350 数据表(HTML) 68 Page - Altera Corporation |
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68 / 86 page ![]() 68 Altera Corporation Mercury Programmable Logic Device Family Data Sheet Figure 33. Mercury AC Test Conditions Operating Conditions Table 20 through 43 provide information on absolute maximum ratings, recommended operating conditions, DC operating conditions, and capacitance for 1.8-V Mercury devices. System C1 (includes jig capacitance) Device input rise and fall times < 3 ns Device Output To Test Power supply transients can affect AC measurements. Simultaneous transitions of multiple outputs should be avoided for accurate measurement. Threshold tests must not be performed under AC conditions. Large-amplitude, fast-ground- current transients normally occur as the device outputs discharge the load capacitances. When these transients flow through the parasitic inductance between the device ground pin and the test system ground, significant reductions in observable noise immunity can result. Table 20. Mercury Device Absolute Maximum Ratings Note (1) Symbol Parameter Conditions Minimum Maximum Unit VCCINT Supply voltage With respect to ground (2) –0.5 2.5 V VCCIO –0.5 4.6 V VI DC input voltage –0.5 4.6 V IOUT DC output current, per pin –34 34 mA TSTG Storage temperature No bias –65 150 ° C TAMB Ambient temperature Under bias –65 135 ° C TJ Junction temperature BGA packages under bias 135 ° C |
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