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MPC5643L 数据表(PDF) 78 Page - Freescale Semiconductor, Inc |
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MPC5643L 数据表(HTML) 78 Page - Freescale Semiconductor, Inc |
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78 / 136 page ![]() MPC5643L Microcontroller Data Sheet, Rev. 8.1 Electrical characteristics Freescale Semiconductor 78 3.4 Thermal characteristics VDD_LV_REGCOR 3 SR Internal supply voltage — — — V VSS_LV_REGCOR 4 SR Internal reference voltage — 0 0 V VDD_LV_CORx 2 SR Internal supply voltage — — — V VSS_LV_CORx 3 SR Internal reference voltage — 0 0 V VDD_LV_PLL 2 SR Internal supply voltage — — — V VSS_LV_PLL 3 SR Internal reference voltage — 0 0 V TA SR Ambient temperature under bias fCPU 120 MHz –40 125 °C TJ SR Junction temperature under bias — –40 150 °C 1 Full functionality cannot be guaranteed when voltage drops below 3.0 V. In particular, ADC electrical characteristics and I/Os DC electrical specification may not be guaranteed. 2 V DD_HV_ADR0 and VDD_HV_ADR1 cannot be operated at different voltages, and need to be supplied by the same voltage source. 3 Can be connected to emitter of external NPN. Low voltage supplies are not under user control. They are produced by an on-chip voltage regulator. 4 For the device to function properly, the low voltage grounds (V SS_LV_xxx) must be shorted to high voltage grounds (VSS_HV_xxx) and the low voltage supply pins (VDD_LV_xxx) must be connected to the external ballast emitter, if one is used. Table 10. Thermal characteristics for 100 LQFP package1 1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. Symbol Parameter Conditions Value Unit RJA D Thermal resistance, junction-to-ambient natural convection2 2 Junction-to-Ambient thermal resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets JEDEC specification for this package. Single layer board – 1s 46 °C/W Four layer board – 2s2p 34 RJMA D Thermal resistance, junction-to-ambient forced convection at 200 ft/min Single layer board – 1s 36 °C/W Four layer board – 2s2p 28 RJB D Thermal resistance junction-to-board3 3 Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for the specified package. —19 °C/W RJC D Thermal resistance junction-to-case4 4 Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is used for the case temperature. Reported value includes the thermal resistance of the interface layer. —8 °C/W JT D Junction-to-package-top natural convection5 5 Thermal characterization parameter indicating the temperature difference between the package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT. —2 °C/W Table 9. Recommended operating conditions (3.3 V) (continued) Symbol Parameter Conditions Min1 Max Unit |
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