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SAP5SD-B-G1-R 数据表(PDF) 54 Page - List of Unclassifed Manufacturers |
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SAP5SD-B-G1-R 数据表(HTML) 54 Page - List of Unclassifed Manufacturers |
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54 / 63 page ![]() SAP5S / SAP51 Universal Actuator-Sensor Interface IC Data Sheet July 17, 2012 © 2012 Zentrum Mikroelektronik Dresden AG — Rev. 3.1 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is PRELIMINARY and subject to changes without notice. 54 of 62 In Master/Repeater Mode the SAP5 provides an AS-i power-fail detector. It consists of a comparator directly connected to the LTGP pin which generates a logic signal in case the voltage at the LTGP pin drops below VAPF (refer to Table 39). A subsequent digital signal processing of the comparator output signal is performed as follows: An anti-bouncing filter removes each signal states shorter than 6 s. This is to eliminate the influence of AS-i telegrams which are added onto the AS-i DC voltage. An additional anti-bouncing filter with different filter times for activation and deactivation of the power- fail signal removes short power-fail pulses. The AS-i power-fail signal is provided directly active HIGH as signal APF. Additionally, in Master Mode, the AS-i power-fail signal modulates the RX_DAT signal, whereas the active state is signaled by logic HIGH level. Table 39: Master/Repeater Mode Parameter Symbol Parameter Min Max Unit Note tloopback Loopback time in Master Mode 4.9 6.5 s 1 VAPF AS-i Power Fail voltage threshold 21. 5 23. 5 V tAPF_RX_DAT minimum activation time for signaling of AS-i Power Fail by use of the RX_DAT signal 640 704 s 2 tAPF_ON_RX_DAT release time of the AS-i Power Fail state within the RX_DAT signal 64 s 2 tAPF_APF minimum activation time for signaling of AS-i Power Fail by use of the APF signal 704 768 s 2 tHOLD_APF AS-i Power Fail hold time 64 s tAPF_OFF delay time after return of the AS-i Power 64 128 s tBREAK break time in case of an erroneous AS-i signal 9 15 s 1 Loopback time is the time difference between an edge in the MAN code of signal TX_DAT and the corresponding edge in the Manchester-code of the signal RX_DAT. The voltage trigger level for measurement of the edge time is defined by VU5R/2. The actual loopback time may be adjusted by programming the ID_Code_Extension_2 EEPROM register as described in Table 38. 2 In Master Mode, the AS-i Power Fail state is already signaled by the RX_DAT signal as soon as the power fail condition is true for a time more than tAPF_RX_DAT. However, in order to start the APF minimum hold state (tHOLD_APF), the power fail condition must remain true for another time period defined by tAPF_ON_RX_DAT. Otherwise, the RX_DAT signal returns to its idle state (logic LOW) immediately. |
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