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STM32F769AI 数据表(PDF) 185 Page - STMicroelectronics |
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STM32F769AI 数据表(HTML) 185 Page - STMicroelectronics |
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185 / 255 page ![]() DocID029041 Rev 4 185/255 STM32F765xx STM32F767xx STM32F768Ax STM32F769xx Electrical characteristics 224 JATG/SWD characteristics Unless otherwise specified, the parameters given in Table 87 for JTAG/SWD are derived from tests performed under the ambient temperature, fHCLK frequency and VDD supply voltage conditions summarized in Table 17, with the following configuration: • Output speed is set to OSPEEDRy[1:0] = 10 • Capacitive load C=30 pF • Measurement points are performed at CMOS levels: 0.5VDD Refer to Section 5.3.20: I/O port characteristics for more details on the input/output alternate function characteristics (SCK,SD,WS). Table 87. Dynamics characteristics: JTAG characteristics Symbol Parameter Conditions Min Typ Max Unit Fpp TCK clock frequency 2.7V <VDD< 3.6V - - 40 MHz 1/tc(TCK) 1.71 <VDD< 3.6V -- 35 tw(TCKH) SCK high and low time - TPCLK − 1TPCLK TPCLK + 1 ns tw(TCKL) tsu(TMS) TMS input setup time - 3 - - th(TMS) TMS input hold time - 0 - - tsu(TDI) TDI input setup time - 0.5 - - th(TDI) TDI input hold time - 2 - - tov (TDO) TDO output valid time 2.7V <VDD< 3.6V - 9 11 1.71 <VDD< 3.6V -9 13 toh(TDO) TDO output hold time - 7.5 - - |
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