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5812-DS01-R 数据表(PDF) 61 Page - Broadcom Corporation. |
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5812-DS01-R 数据表(HTML) 61 Page - Broadcom Corporation. |
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61 / 84 page ![]() BCM5812 Advance Data Sheet 3/11/03 B roa dcom Co rpo rat ion Page 53 Signal Definitions Document 5812-DS01-405-R SIGNAL DEFINITIONS Table 17: Signal Definitions Signal Name I/O Description AD[31:0] IO PCI multiplexed Address/Data bus. PCI_CLK I PCI Clock, 33 MHz. GNT I PCI Bus Grant allowing BCM5812 to use the bus. FRAME IO PCI Frame, indicates the beginning and duration of a master transfer. IRDY IO PCI Initiator ready. TRDY IO PCI Target ready. DEVSEL IO PCI Device Select, asserted by an access target. STOP IO PCI Stop, requesting that the current master stop an active transfer. PERR IO PCI Parity Error. SERR O PCI System Error, open drain. PAR IO PCI Parity. REQ O PCI Bus Request. RST I PCI Reset, tri-states all PCI outputs. INTA O PCI interrupt output, open drain. C/BE[3:0] IO PCI Command/Byte Enable, provides PCI bus command and data byte enables. IDSEL I PCI Initialization Device Request, used for PCI configuration cycles. LOCK I PCI lock for atomic operation, must be pulled up to VDDO. VDDC – Core power pins, must be connected to a 1.8V(core) source. VDDO – Peripheral power pins, must be connected to a 3.3V(I/O) source. GND – Core and Peripheral ground pins. AVCC1 – Analog VCC for PLL1, must be connected to a quiet 1.8V source. AGND1 – Analog GND for PLL1. AVCC2 – Analog VCC for PLL2, must be connected to a quiet 1.8V source. AGND2 – Analog GND for PLL2. VIO – PCI clamp voltage bias. Connect to 3.3V for 3.3V signaling environments.Connect to 5V for 5V signaling environments. SGND – Clamp ground (substrate ground). EXPORT I EXPORT pin (high = 56-bit DES encryption; disable ARCFOUR; disable AES; low = 3DES strong encryption; enable ARCFOUR; enable AES). TEST I Test pin, must be grounded for regular operation. When TEST is high, all outputs are tri-stated. It is internally pulled down. TRST I Must be connected to ground for normal operation. Used for boundary scan JTAG testing. It is internally pulled down. TMS I Test mode select for JTAG boundary scan. Must be connected to VDDO for normal operation. It is internally pulled up. |
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