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4200A-SCS Parameter Analyzer

1. Clarius Software

Take your research to new levels of understanding with

the new Clarius Software user interface. The 4200A-SCS

includes the Clarius+ software package, which allows

peforming nearly any type of I-V, C-V, and pulsed I-V

characterization test. The Clarius Software user interface

provides touch-and-swipe or point-and-click control for

advanced test definition, parameter analysis, graphing,

and automation capabilities for modern semiconductor,

materials, and process characterization.

Key Features

• Ready-to-use, modifiable application tests, projects

and devices that reduce test development time

• Industry’s first instrument with built-in measurement

videos from world-wide Application engineers, in four

languages, to reduce learning curve

• Pin to pad contact check ensures reliable

measurements

• Multiple measurement functions

• Data display, analysis and arithmetic functions

Reduce Characterization Complexity

with Expert Videos

Engage quickly with your application and reduce

your learning curve by watching built-in videos from

Keithley worldwide application engineers. Hours of

expert measurement expertise help will guide you when

unexpected results occur or questions arise on how to set

up your test. All videos are provided in English, and many

are translated into other languages including Chinese,

Japanese, and Korean. These short expert videos enable

quick insight to your bold discoveries.

Select from Ready-to-Use Application Tests

With over 450 furnished application tests in the Clarius

library, select or modify the pre-defined application tests

to accelerate your characterization or easily create custom

tests from the beginning. With three easy steps, Clarius

Software guides even the new user through parameter

analysis like an expert.

Real-time Results and Parameters

Accelerate your time to insight with automated data

display, arithmetic functions, analysis and real-time

parameter extraction. Never worry about losing your

data because all test history is stored.

Verify Pulse Measurements without an

Oscilloscope

Pulse timing preview mode provides an easy-to-read view

of your pulse timing parameters that confirms your pulsed

I-V test will execute as needed. Use the transient I-V

or waveform capture mode to make time-based current

or voltage measurements without the need of an

external oscilloscope.

Typical Applications

MOSFET, BJT Transistors

Materials Characterization

Non-volatile Memory Devices

Resistivity & Hall Effect Measurements

NBTI/PBTI

III-V Devices

Failure Analysis

Nanoscale Devices

Diodes and pn Junctions

Solar Cells

Sensors

MEMS Devices

Electrochemistry

LED and OLED

4225-RPM 数据表(PDF) 4 Page - TEKTRONIX, INC.

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