4225-RPM datasheet(10/45 Pages) TEKTRONIX

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4200A-SCS Parameter Analyzer

4. Ultra-fast Pulse Measure Unit (PMU)

Ultra-fast I-V sourcing and measuring have become

increasingly important capabilities for many technologies,

including compound semiconductors, medium power

devices, non-volatile memory, MEMS devices and more.

The 4225-PMU instrument card integrates ultra-

fast voltage waveform generation and signal observation

capabilities into the already-powerful 4200A-SCS

test environment to deliver unprecedented I-V testing

performance, expanding the system’s materials, device,

and process characterization dramatically. It replaces

traditional pulse/measure hardware configurations, which

typically included an external pulse generator, a multi-

channel oscilloscope, specially designed interconnect

hardware, and integrated software.

Minimize self-heating effects with ultra-fast pulsed I-V.

Each module has two independent channels. Each

channel can measure both voltage and current

simultaneously with parallel 14-bit A/D converters

with deep memory, allowing up to one million samples

at 5 ns per sample (200 MS/s).

Three Operating Modes for Complete

Characterization

The 4225-PMU can be used to perform three types

of ultra-fast I-V tests: pulsed I-V, transient I-V, and

pulsed sourcing.

Pulsed I-V refers to any test with a pulsed source and a

corresponding high speed, timed-based measurement

that provides DC-like results. Using pulsed I-V signals

to characterize devices rather than DC signals makes

it possible to study or reduce the effects of self-heating

(Joule heating) or to minimize current drift or degradation

in measurements due to trapped charge.

Transient I-V or waveform capture is a time-based

current and/or voltage measurement that is typically the

capture of a pulsed waveform. A transient test is typically

a single pulse waveform that is used to study time-varying

parameters, such as the drain current degradation versus

time due to charge trapping or self-heating. Transient I-V

measurements can be made to test a dynamic test circuit

or can be used as a diagnostic tool for choosing the

appropriate pulse settings in the pulsed I-V mode.

Pulsed Sourcing involves outputting user-defined two-

level or multi-level pulses using the built-in Segment

ARB® function or outputting an

arbitrarily defined waveform.

When the instrument’s Segment

ARB mode is used for multi-

level pulsing, individual voltage

segments can be as short as

20 ns and waveforms can have

up to 2048 unique segments

per channel, which provides

the flexibility necessary to build

waveforms for characterizing

flash devices and other non-

volatile memory technologies.

Pulsed I-V

Pulse/Measure with DC-like results

Train, Sweep, Step modes

General device characterization

Transient I-V

Time-based I and V measurements

Waveform capture

Dynamic device testing

Pulsed Sourcing

Multi-level pulsing

Arbitrary waveform generator

AC stress testing with measure

Measure Window

Time

Samples

Sequence A

2 3 4 5

Time

Sequence A Definition

Segment Start V Stop V Duration

4225-PMU Operating Modes.

4225-RPM 数据表(PDF) 10 Page - TEKTRONIX, INC.

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