STV-6410-R01 datasheet(95/105 Pages) STMICROELECTRONICS

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CMOS Sensor; Customer Datasheet, Rev 3.0, 28 September 2000

VV5410 & VV6410

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13. Pixel Defect Speciﬁcation

13.1 Pixel Fault Deﬁnitions

Please find the pixel notation described in Figure 49 below. For the purposes of the test the 3x3 array describes 9 bayer pixels of

a common colour, i.e. ALL the pixels will either be Red, Green or Blue. The pixel under test is X.

Figure 49 : Pixel Numbering Notation

13.2 Stuck at White Pixel Fault

A pixel is said to be “stuck at white” - it can also be referred to as “hot” - if it is saturated (pixel output at maximum) even with no

incident light and exposure set to zero.

13.3 Stuck at Black Pixel Fault

A pixel is said to be “stuck at black” - it can also be referred to as “dead” - if the pixel output is zero even if the pixel is fully

exposed to incident light.

13.4 Column / Row Faults

A line of continuous pixel fails of length > 3 will be described as a row fault in the x-direction and a column fault in the y-direction.

If the array contains more than 1 row or column fault and the defective pixels overlap as shown in Figure 50 then this fault is

described as a double row or double column fault respectively. The minimum overlap is 1 pixel. A defective pixel is indicated by X

and a good pixel by ‘p’.

Figure 50 : Double Column Fault

In Figure 51 there are 2 column faults however there is no overlap between the 2 columns therefore there are 2 single column

faults but no double column faults.

[0]

[1]

[2]

[7]

[3]

[6]

[5]

[4]

n+1

‘p’

STV-6410-R01 数据表(PDF) 95 Page - STMicroelectronics