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STV-6410-R01 数据表(PDF) 96 Page - STMicroelectronics |
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STV-6410-R01 数据表(HTML) 96 Page - STMicroelectronics |
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96 / 105 page ![]() VV5410 & VV6410 Pixel Defect Specification cd5410-6410f-3-0.fm Commercial in confidence 96/105 Figure 51 : Single Column Faults 13.5 Image Array Blemishes The automatic test programme rejects any sensors that contain blemishes referred to as blobs and clusters (please see below for definitions of these terms) as they cannot be successfully defect corrected by ST coprocessor devices. Up to 120 single pixel faults can be corrected and sensors meeting this criteria will PASS this part of the test programme. 13.5.1 Cluster Definition A failing pixel at X with a failing pixel at position [0] or [1] or [2] or [3] or [4] or [5] or [6] or [7] or any combination of these 8 positions except the case where all positions are defective. This is a special case and is described below. In the example in Figure 52 there are additional pixel fails in positions [3] and [7]. Figure 52 : Cluster Example Blob (special case of cluster):- a failing pixel at position X with failing pixels at position [0],[1],[2],[3],[4],[5],[6] and [7] as in Figure 53 below: Figure 53 : Blob Example n n+1 X ‘p’ X ‘p’ X p X ‘p’ ‘p’ X ‘p’ X ‘p’ X ‘p’ X [0] [1] [2] [X] X [X] [6] [5] [4] [X][X][X] [X] X [X] [X][X][X] |
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