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CC2500-RTR1 数据表(PDF) 75 Page - Texas Instruments |
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CC2500-RTR1 数据表(HTML) 75 Page - Texas Instruments |
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75 / 84 page ![]() CC2500 PRELIMINARY Data Sheet (Rev.1.2) SWRS040A Page 75 of 83 0x2C: TEST2 – Various test settings Bit Field Name Reset R/W Description 7:0 TEST2[7:0] 152 (0x88) R/W The value to use in this register is given by the SmartRF® Studio software. 0x2D: TEST1 – Various test settings Bit Field Name Reset R/W Description 7:0 TEST1[7:0] 49 (0x31) R/W The value to use in this register is given by the SmartRF® Studio software. 0x2E: TEST0 – Various test settings Bit Field Name Reset R/W Description 7:0 TEST0[7:0] 11 (0x0B) R/W The value to use in this register is given by the SmartRF® Studio software. 31.3 Status register details 0x30 (0xF0): PARTNUM – Chip ID Bit Field Name Reset R/W Description 7:0 PARTNUM[7:0] 128 (0x80) R Chip part number 0x31 (0xF1): VERSION – Chip ID Bit Field Name Reset R/W Description 7:0 VERSION[7:0] 3 (0x03) R Chip version number. 0x32 (0xF2): FREQEST – Frequency Offset Estimate from demodulator Bit Field Name Reset R/W Description 7:0 FREQOFF_EST R The estimated frequency offset (two’s complement) of the carrier. Resolution is FXTAL/2 14 (1.59 - 1.65 kHz); range is ±202 kHz to ±210 kHz, dependent of XTAL frequency. Frequency offset compensation is only supported for FSK and MSK modulation. This register will read 0 when using OOK modulation. |
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