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ST92F124 数据表(PDF) 61 Page - STMicroelectronics |
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ST92F124 数据表(HTML) 61 Page - STMicroelectronics |
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61 / 429 page ![]() 61/429 ST92F124/F150/F250 - SINGLE VOLTAGE FLASH & E3 TM (EMULATED EEPROM) 3.5 PROTECTION STRATEGY The protection bits are stored in the 4 locations from 231FFCh to 231FFFh (see Figure 34). All the available protections are forced active dur- ing reset, then in the initialisation phase they are read from the TestFlash. The protections are stored in 2 Non Volatile Regis- ters. Other 2 Non Volatile Registers can be used as a password to re-enable test modes once they have been disabled. The protections can be programmed using the Set Protection operation (see Control Registers para- graph), that can be executed from all the internal or external memories except the Flash or Test- Flash itself. The TestFlash area (230000h to 231F7Fh) is al- ways protected against write access. Figure 34. Protection Register Map 3.5.1 Non Volatile Registers The 4 Non Volatile Registers used to store the pro- tection bits for the different protection features are one time programmable by the user. Access to these registers is controlled by the pro- tections related to the TestFlash. Since the code to program the Protection Registers cannot be fetched by the Flash or the TestFlash memories, this means that, once the APRO or APBR bits in the NVAPR register are programmed, it is no long- er possible to modify any of the protection bits. For this reason the NV Password, if needed, must be set with the same Set Protection operation used to program these bits. For the same reason it is strongly advised to never program the WPBR bit in the NVWPR register, as this will prevent any fur- ther write access to the TestFlash, and conse- quently to the Protection Registers. NON VOLATILE ACCESS PROTECTION REG- ISTER (NVAPR) Address: 231FFCh - Read/Write Delivery value: 1111 1111 (FFh) Bit 7 = Reserved. Bit 6 = APRO: FLASH access protection. This bit, if programmed at 0, disables any access (read/write) to operands mapped inside the Flash address space (E3 TM excluded), unless the current instruction is fetched from the TestFlash or from the Flash itself. 0: ROM protection on 1: ROM protection off Bit 5 = APBR: TestFlash access protection. This bit, if programmed at 0, disables any access (read/write) to operands mapped inside the Test- Flash, the OTP and the protection registers, un- less the current instruction is fetched from the TestFlash or the OTP area. 0: TestFlash protection on 1: TestFlash protection off Bit 4 = APEE: E3 TM access protection. This bit, if programmed at 0, disables any access (read/write) to operands mapped inside the E3 TM address space, unless the current instruction is fetched from the TestFlash or from the Flash, or from the E3 TM itself. 0: E3 TM protection on 1: E3 TM protection off Bit 3 = APEX: Access Protection from External memory. This bit, if programmed at 0, disables any access (read/write) to operands mapped inside the ad- dress space of one of the internal memories (Test- Flash, Flash, E3 TM, RAM), if the current instruction is fetched from an external memory. 0: Protection from external memory on 1: Protection from external memory off NVAPR NVWPR 231FFCh 231FFDh 231FFEh NVPWD0 NVPWD1 231FFFh 765 432 10 1 APRO APBR APEE APEX PWT2 PWT1 PWT0 9 |
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