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4LS 数据表(PDF) 71 Page - OSRAM GmbH |
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4LS 数据表(HTML) 71 Page - OSRAM GmbH |
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71 / 115 page ![]() Document Feedback 4LS Register Description Datasheet • PUBLIC DS000542 • v3-01 • 2022-Nov-17 114 │ 70 Address: 0x0E Default Value: 0x30 Access: Read/Write Bit Bit Name Default Bit Description 4:4 NAND Tree Mode 1b Internal Debug Purposes When set to ‘0’ places the NAND tree active to perform the test. To disable the NAND tree test mode this bit should be ‘1’. 3:3 SRAM Mode 0b Internal Debug Purposes When set to ‘1’ defines the SRAM memory test mode. It uses the content of register 0x17 and 0x18. 2:2 Training Mode 0b When set to ‘1’ defines the training test data mode to be sent by the output LVDS data. It uses the content of register 0x12 and 0x16. When set to ‘0’ the Data is received from the Pixels. 1:1 Counter Test Mode 0b Internal Debug Purposes When set to ‘1’ defines the test mode for counter block. 0:0 ADC Test Mode 0b Internal Debug Purposes When set to ‘1’ defines the test mode for the ADC block. 9.1.16 Training Sequence 1 Line 1 Register (Address 0x0F) Figure 114: TSQ1L1Reg Address: 0x0F Default Value: 0xFF Access: Read/Write Bit Bit Name Default Bit Description 7:0 Training sequence 1 11111111b Defines the 8 MSBs for word A training sequence sent over the LVDS driver of Line 1 for FPGA synchronization purposes. |
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