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ADATE305 数据表(PDF) 19 Page - Analog Devices |
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ADATE305 数据表(HTML) 19 Page - Analog Devices |
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19 / 56 page ![]() ADATE305 Rev. 0 | Page 19 of 56 ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE Table 14. Parameter Rating Supply Voltages Positive Supply Voltage (VDD to GND) −0.5 V to +11.0 V Positive VCC Supply Voltage (VCC to GND) −0.5 V to +4.0 V Negative Supply Voltage (VSS to GND) −6.25 V to +0.5 V Supply Voltage Difference (VDD to VSS) −1.0 V to +16.5 V Reference Ground (DUTGND to GND) −0.5 V to +0.5 V AGND to DGND −0.5 V to +0.5 V VPLUS Supply Voltage (VPLUS to GND) −0.5 V to +17.5 V Input Voltages Input Common-Mode Voltage VSS to VDD Short-Circuit Voltage1 −3.0 V to +8.0 V High Speed Input Voltage2 0.0 V to VCC High Speed Differential Input Voltage3 0.0 V to VCC VREF −0.5 V to +5.5 V DUTx I/O Pin Current DCL Maximum Short-Circuit Current4 ±140 mA Temperature Operating Temperature, Junction 125°C Storage Temperature Range −65°C to +150°C For liquid cooled applications, θJC = 1.1°C/W. Table 15. Thermal Resistance Airflow θJA Unit Natural Convection 33 °C/W 1 meter per second 30 °C/W 2 meters per second 28.5 °C/W EXPLANATION OF TEST LEVELS D Definition S Design verification simulation P 100% production tested PF Functionally checked during production test CT Characterized on tester CB Characterized on bench ESD CAUTION 1 RL = 0 Ω, VDUT continuous short-circuit condition, (VH, VL, VT, high-Z, VCOM, clamp modes). 2 DATAxP, DATAxN, RCVxP, RCVxN, under source R = 0 Ω. 3 DATAxP to DATAxN, RCVxP, RCVxN. 4 RL = 0 Ω, VDUTx = –3 V to +8 V; DCL current limit. Continuous short-circuit condition. ADATE305 must current limit and survive continuous short circuit. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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