MPC5633MMLL80 datasheet(72/106 Pages) FREESCALE

72 / 106 page

MPC5634M Microcontroller Data Sheet, Rev. 8

Freescale Semiconductor

4.4

Electromagnetic Interference (EMI) characteristics

4.5

Electromagnetic static discharge (ESD) characteristics

Table 12. EMI testing specifications1

1 IEC Classification Level: L = 24dBuV; K = 30dBuV.

Symbol

Parameter

Conditions

fOSC/fBUS

Frequency

Level

(Typ)

Unit

Radiated

Emissions

VEME

Device

Configuration, test

conditions and EM

testing per standard

IEC61967-2; Supply

Voltage = 5.0V DC,

Ambient

Temperature =

25°C, Worst-case

Orientation

Oscillator

Frequency = 8

MHz;

System Bus

Frequency = 80

MHz;

No PLL Frequency

Modulation

150 kHz – 50 MHz

V

50–150 MHz

150–500 MHz

500–1000 MHz

IEC Level

—

Oscillator

Frequency = 8

MHz;

System Bus

Frequency = 80

MHz;

1% PLL

Frequency

Modulation

150 kHz – 50 MHz

V

50–150 MHz

150–500 MHz

500–1000 MHz

IEC Level

—

Table 13. ESD ratings1,2

1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated

Circuits.

2 Device failure is defined as: “If after exposure to ESD pulses, the device does not meet the device specification

requirements, which includes the complete DC parametric and functional testing at room temperature and hot

temperature.”

Symbol

Parameter

Conditions

Value

Unit

—

ESD for Human Body Model (HBM)

—

2000

HBM circuit description

—

1500



CSR

—

100

—

ESD for field induced charge Model (FCDM) All pins

500

Corner pins

750

—

Number of pulses per pin

Positive pulses (HBM)

—

Negative pulses (HBM)

—

Number of pulses

—

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