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ANSELA 数据表(PDF) 121 Page - Microchip Technology |
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ANSELA 数据表(HTML) 121 Page - Microchip Technology |
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121 / 222 page ![]() 2013 Microchip Technology Inc. DS22331A-page 121 MCP19111 21.0 INTERNAL TEMPERATURE INDICATOR MODULE The MCP19111 is equipped with a temperature circuit designed to measure the operating temperature of the silicon die. The circuit's range of the operating temperature falls between -40°C and +125°C. The output is a voltage that is proportional to the device temperature. The output of the temperature indicator is internally connected to the device ADC. 21.1 Circuit Operation The TMPSEN bit in the ABECON register, Register 6-15, is set to enable the internal temperature measurement circuit. The MCP19111 overtemperature shutdown feature is NOT controlled by this bit. FIGURE 21-1: TEMPERATURE CIRCUIT DIAGRAM 21.2 Temperature Output The output of the circuit is measured using the internal analog-to-digital converter. Channel 10 is reserved for the temperature circuit output. Refer to Section 22.0 “Analog-to-Digital Converter (ADC) Module” for detailed information. The temperature of the silicon die can be calculated by the ADC measurement by using Equation 21-1. EQUATION 21-1: SILICON DIE TEMPERATURE TSEN ADC MUX TSRNG VDD ADC CHS bits (ADCON0 register) n VOUT TEMP_DIE ADC READING 1.75 – 13.3mV/ C ----------------------------------------------------------- = |
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