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STM32F303VC 数据表(PDF) 65 Page - STMicroelectronics

部件名 STM32F303VC
功能描述  ARM Cortex-M4F 32b MCUFPU, up to 256KB Flash48KB SRAM
PDF  133 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32F303VC 数据表(HTML) 65 Page - STMicroelectronics

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STM32F302xx/STM32F303xx
Electrical characteristics
Doc ID 023353 Rev 5
65/133
Table 30.
Typical and maximum VDD consumption in Stop and Standby modes
Symbol Parameter
Conditions
Typ @VDD (VDD=VDDA)Max
(1)
Unit
2.0V 2.4V 2.7V 3.0 V 3.3 V 3.6 V
TA =
25 °C
TA =
85 °C
TA =
105 °C
IDD
Supply
current in
Stop mode
Regulator in run mode,
all oscillators OFF
20.05 20.33 20.42 20.50 20.67 20.80 44.2(2)
553 1202(2)
µA
Regulator in low-power
mode, all oscillators OFF
7.63
7.77
7.90
8.07
8.17
8.33 30.6(2)
529 1156(2)
Supply
current in
Standby
mode
LSI ON and IWDG ON
0.80
0.96
1.09
1.23
1.37
1.51
-
-
-
LSI OFF and IWDG OFF 0.60
0.74
0.83
0.93
1.02
1.11
5.0(2)
7.8
13.3(2)
1.
Data based on characterization results, not tested in production unless otherwise specified.
2.
Data based on characterization results and tested in production.
Table 31.
Typical and maximum VDDA consumption in Stop and Standby modes
Symbol Parameter
Conditions
Typ @VDD (VDD = VDDA)Max
(1)
Unit
2.0 V 2.4 V 2.7 V 3.0 V 3.3 V 3.6 V
TA =
25 °C
TA =
85 °C
TA =
105 °C
IDDA
Supply
current in
Stop mode
Regulator in run mode,
all oscillators OFF
1.81 1.95 2.07 2.20 2.35 2.52
3.7
5.5
8.8
µA
Regulator in low-power
mode, all oscillators
OFF
1.81 1.95 2.07 2.20 2.35 2.52
3.7
5.5
8.8
Supply
current in
Standby
mode
LSI ON and IWDG ON
2.22 2.42 2.59 2.78
3.0
3.24
-
-
-
LSI OFF and IWDG
OFF
1.69 1.82 1.94 2.08 2.23 2.40
3.5
5.4
9.2
Supply
current in
Stop mode
Regulator in run mode,
all oscillators OFF
1.05 1.08 1.10 1.15 1.22 1.29
-
-
-
Regulator in low-power
mode, all oscillators
OFF
1.05 1.08 1.10 1.15 1.22 1.29
-
-
-
Supply
current in
Standby
mode
LSI ON and IWDG ON
1.44 1.52 1.60 1.71 1.84 1.98
-
-
-
LSI OFF and IWDG
OFF
0.93 0.95 0.98 1.02 1.08 1.15
-
-
-
1.
Data based on characterization results, not tested in production.



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