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LSM9DS0 数据表(PDF) 14 Page - STMicroelectronics |
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LSM9DS0 数据表(HTML) 14 Page - STMicroelectronics |
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14 / 74 page ![]() Module specifications LSM9DS0 14/74 DocID024763 Rev 2 G_SoDr Angular rate sensitivity change vs. temperature From -40 °C to +85 °C ±2 % LA_TyOff Linear acceleration typical zero-g level offset accuracy(3)(4) ±60 mg G_TyOff Angular rate typical zero-rate level FS = 245 dps ±10 dps FS = 500 dps ±15 FS = 2000 dps ±25 LA_TCOff Linear acceleration zero-g level change vs. temperature Max delta from 25 °C ±0.5 mg/°C G_TCOff Zero-rate level change vs. temperature ±0.05 dps/°C M_EF Maximum exposed field No perming effect on zero reading 10000 gauss M_DF Magnetic disturbing field Sensitivity starts to degrade. Automatic S/R pulse restores the sensitivity(5) 20 gauss LA_ST Linear acceleration self-test positive difference (6)(7) ±2 g range, X, Y, Z-axis AST1:0 = 01 see Table 74 60 1700 mg G_ST Angular rate self-test output change (8)(9) FS = 245 dps 20 250 dps FS = 500 dps 70 400 FS = 2000 dps 150 1000 Top Operating temperature range -40 +85 °C 1. Typical specifications are not guaranteed 2. Verified by wafer level test and measurement of initial offset and sensitivity 3. Typical zero-g level offset value after MSL3 preconditioning 4. Offset can be eliminated by enabling the built-in high-pass filter 5. Set / Reset Pulse is automatically applied at each conversion cycle 6. “Self-test output change” is defined as: OUTPUT[mg](CTRL_REG2_XM (21h) AST1:0 enabled) - OUTPUT[mg](CTRL_REG2_XM (21h) AST1:0 disabled) 7. For polarity refer to Table 77: Self-test mode configuration 8. “Self-test output change” is defined as: OUTPUT[mg](CTRL_REG4_G (23h) ST1:0 enabled) - OUTPUT[mg](CTRL_REG4_G (23h) ST1:0 disabled) 9. For polarity refer to Table 31: Self-test mode configuration Table 3. Sensor characteristics (continued) Symbol Parameter Test conditions Min. Typ.(1) Max. Unit |
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