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LSM9DS0 数据表(PDF) 14 Page - STMicroelectronics

部件名 LSM9DS0
功能描述  iNEMO inertial module 3D accelerometer, 3D gyroscope, 3D magnetometer
PDF  74 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

LSM9DS0 数据表(HTML) 14 Page - STMicroelectronics

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Module specifications
LSM9DS0
14/74
DocID024763 Rev 2
G_SoDr
Angular rate sensitivity
change vs. temperature
From -40 °C to +85 °C
±2
%
LA_TyOff
Linear acceleration typical
zero-g level offset
accuracy(3)(4)
±60
mg
G_TyOff
Angular rate
typical zero-rate level
FS = 245 dps
±10
dps
FS = 500 dps
±15
FS = 2000 dps
±25
LA_TCOff
Linear acceleration zero-g
level change vs. temperature
Max delta from 25 °C
±0.5
mg/°C
G_TCOff
Zero-rate level change vs.
temperature
±0.05
dps/°C
M_EF
Maximum exposed field
No perming effect on zero
reading
10000
gauss
M_DF
Magnetic disturbing field
Sensitivity starts to degrade.
Automatic S/R pulse restores
the sensitivity(5)
20
gauss
LA_ST
Linear acceleration self-test
positive difference (6)(7)
±2 g range, X, Y, Z-axis
AST1:0 = 01 see Table 74
60
1700
mg
G_ST
Angular rate self-test output
change (8)(9)
FS = 245 dps
20
250
dps
FS = 500 dps
70
400
FS = 2000 dps
150
1000
Top
Operating temperature range
-40
+85
°C
1. Typical specifications are not guaranteed
2. Verified by wafer level test and measurement of initial offset and sensitivity
3. Typical zero-g level offset value after MSL3 preconditioning
4. Offset can be eliminated by enabling the built-in high-pass filter
5. Set / Reset Pulse is automatically applied at each conversion cycle
6. “Self-test output change” is defined as: OUTPUT[mg](CTRL_REG2_XM (21h) AST1:0 enabled) - OUTPUT[mg](CTRL_REG2_XM
(21h) AST1:0 disabled)
7. For polarity refer to Table 77: Self-test mode configuration
8. “Self-test output change” is defined as: OUTPUT[mg](CTRL_REG4_G (23h) ST1:0 enabled) - OUTPUT[mg](CTRL_REG4_G (23h)
ST1:0 disabled)
9. For polarity refer to Table 31: Self-test mode configuration
Table 3. Sensor characteristics (continued)
Symbol
Parameter
Test conditions
Min.
Typ.(1)
Max.
Unit



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