 2013 Microchip Technology Inc.

DS20005228A-page 13

MCP8024

Note:

test to an ambient temperature equal to the desired junction temperature. The test time is small enough such that the

rise in Junction temperature over the Ambient temperature is not significant.

FIGURE 2-13: 12V LDO Dynamic Loadstep -

Falling Current.

FIGURE 2-14: 12V LDO Output Voltage vs

Rising Input Voltage.

FIGURE 2-15: Quiescent Current vs

Temperature.

FIGURE 2-16: Trapezoidal Back EMF.

FIGURE 2-17: PWM Deadtime.

FIGURE 2-18: Buck Snubber Turn On.

-40

-30

-20

-10

0

10

20

30

40

0

5

10

15

20

25

Time (ms)

Vout (AC)

Vin = 14V

Vout = 12V

Cin = Cout = 10 µF

Iout = 20 mA to 1 mA Step

10.0

10.5

11.0

11.5

12.0

12.5

13.0

0

5

10

15

20

25

30

Vin (V)

Vout = 12V

Cin = Cout = 10 µF

Iout = 20 mA

Charge Pump

Hysteresis

0

200

400

600

800

1000

1200

-45

-20

5

30

55

80

105

130

155

Temperature (°C)

CE Low

CE High

0.0

0.5

1.0

1.5

2.0

2.5

Time ( ms)

PHA

PHB

PHC

0

102030405060

Time (µs)

Dead Time

Dead Time

PWMxH

PWMxL

0

4

8

12

16

20

0.10

0.12

0.14

0.16

0.18

0.20

Time (µs)

Snubber

No Snubber

Switch ON