数据搜索系统,热门电子元器件搜索
  Chinese  ▼
ALLDATASHEETCN.COM

X  

MPXM2102AS 数据表(PDF) 21 Page - Motorola, Inc

部件名 MPXM2102AS
功能描述  Sensor
PDF  670 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  MOTOROLA [Motorola, Inc]
网页  http://www.freescale.com
标志 MOTOROLA - Motorola, Inc

MPXM2102AS 数据表(HTML) 21 Page - Motorola, Inc

Back Button MPXM2102AS Datasheet HTML 17Page - Motorola, Inc MPXM2102AS Datasheet HTML 18Page - Motorola, Inc MPXM2102AS Datasheet HTML 19Page - Motorola, Inc MPXM2102AS Datasheet HTML 20Page - Motorola, Inc MPXM2102AS Datasheet HTML 21Page - Motorola, Inc MPXM2102AS Datasheet HTML 22Page - Motorola, Inc MPXM2102AS Datasheet HTML 23Page - Motorola, Inc MPXM2102AS Datasheet HTML 24Page - Motorola, Inc MPXM2102AS Datasheet HTML 25Page - Motorola, Inc Next Button
Zoom Inzoom in Zoom Outzoom out
 21 / 670 page
background image
1–15
Motorola Sensor Device Data
www.motorola.com/semiconductors
Figure 4. Example of Process Control Chart Showing Oven Temperature Data
147
148
149
150
151
152
153
154
0
1
2
3
4
5
6
7
UCL = 152.8
= 150.4
LCL = 148.0
UCL = 7.3
= 3.2
LCL = 0
X
R
Where D4, D3 and A2 are constants varying by sample
size,with values for sample sizes from 2 to 10 shown in the
following partial table:
n
2
34
56
789
10
D4 3.27 2.57 2.28 2.11 2.00 1.92 1.86 1.82 1.78
D3
*
*
*
*
*
0.08
0.14
0.18
0.22
A2 1.88 1.02 0.73 0.58 0.48 0.42 0.37 0.34 0.31
* For sample sizes below 7, the LCLR would technically be
a negative number; in those cases there is no lower control
limit; this means that for a subgroup size 6, six “identical”
measurements would not be unreasonable.
Control charts are used to monitor the variability of critical
process parameters. The R chart shows basic problems with
piece to piece variability related to the process. The X chart
can often identify changes in people, machines, methods,
etc. The source of the variability can be difficult to find and
may require experimental design techniques to identify
assignable causes.
Some general rules have been established to help deter-
mine when a process is OUT-OF-CONTROL. Figure 5 shows
a control chart subdivided into zones A, B, and C corre-
sponding to 3 sigma, 2 sigma, and 1 sigma limits respectively.
In Figure 6 through Figure 9 four of the tests that can be used
to identify excessive variability and the presence of assignable
causes are shown. As familiarity with a given process
increases, more subtle tests may be employed successfully.
Once the variability is identified, the cause of the variability
must be determined. Normally, only a few factors have a signif-
icant impact on the total variability of the process. The impor-
tance of correctly identifying these factors is stressed in the
following example. Suppose a process variability depends on
the variance of five factors A, B, C, D and E. Each has a vari-
ance of 5, 3, 2, 1 and 0.4 respectively.
Since:
s tot + sA2 ) s B2 ) s C2 ) s D2 ) s E2
s tot + 52 ) 32 ) 22 ) 12 ) (0.4)
2 + 6.3
Now if only D is identified and eliminated then;
s tot + 52 ) 32 ) 22 ) (0.4)
2 + 6.2
This results in less than 2% total variability improvement.
If B, C and D were eliminated, then;
s tot + 52 ) (0.4)
2 + 5.02
This gives a considerably better improvement of 23%. If
only A is identified and reduced from 5 to 2, then;
s tot + 22 ) 32 ) 22 ) 12 ) (0.4)
2 + 4.3
Identifying and improving the variability from 5 to 2 gives
us a total variability improvement of nearly 40%.
Most techniques may be employed to identify the primary
assignable cause(s). Out-of-control conditions may be
correlated to documented process changes. The product
may be analyzed in detail using best versus worst part
comparisons or Product Analysis Lab equipment. Multi-vari-
ance analysis can be used to determine the family of varia-
tion (positional, critical or temporal). Lastly, experiments may
be run to test theoretical or factorial analysis. Whatever
method is used, assignable causes must be identified and
eliminated in the most expeditious manner possible.
After assignable causes have been eliminated, new
control limits are calculated to provide a more challenging
variability criteria for the process. As yields and variability
improve, it may become more difficult to detect improve-
ments because they become much smaller. When all
assignable causes have been eliminated and the points
remain within control limits for 25 groups, the process is said
to be in a state of control.
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


数据表 下载

Go To PDF Page


链接网址



ALLDATASHEET是否为您带来帮助?  [ DONATE ] 

关于 Alldatasheet   |   广告服务   |   联系我们   |   隐私政策   |   数据表链接    |   链接交换   |   制造商名单
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com