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ADP1034ACPZ-1-R7 数据表(PDF) 10 Page - Analog Devices |
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ADP1034ACPZ-1-R7 数据表(HTML) 10 Page - Analog Devices |
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10 / 41 page ![]() Data Sheet ADP1034 ABSOLUTE MAXIMUM RATINGS analog.com Rev. 0 | 10 of 41 Table 7. Parameter Rating VINP to PGNDP 61 V SWP to PGNDP VINP + 70 V or 110 V, whichever is lower SWP to VINP 110 V – VINP or 70 V, whichever is lower SLEW to GNDP −0.3 V to VINP + 0.3 V EN to GNDP −0.3 V to +61 V VOUT1 to SGND2 35 V FB1 to SGND2 −0.3 V to +3.3V VOUT1 to VOUT3 61 V SW2 to SGND2 −0.3 V to VOUT1 + 0.3 V VOUT2 to SGND2 6 V SW3 to SGND2 VOUT3 − 0.3 V to VOUT1 + 0.3 V VOUT3 to SGND2 −26 V to +0.3 V FB3 to VOUT3 −0.3 V to +3.3V SVDD1 to SGND1 6.0 V SVDD2 to SGND2 6.0 V SSS, SCK, SI, SO to SGND1 −0.3 V to SVDD1 + 0.3 V SGPI1, SGPO2, SGPI3 to SGND2 −0.3 V to SVDD2 + 0.3 V SYNC to SGND2 −0.3 V to +6 V PPC_IN to SGND2 −0.3 V to +6 V MVDD to MGND 6.0 V MSS, MCK, MO, MI to MGND −0.3 V to MVDD + 0.3 V MGPO1, MGPI2, MGPO3 to MGND −0.3 V to MVDD + 0.3 V Common-Mode Transients ±100 kV/μs Operating Junction Temperature Range1 −40°C to +125°C Storage Temperature Range −65°C to +150°C Lead Temperature JEDEC industry standard Soldering Conditions JEDEC J-STD-020 1 Power dissipated on chip must be derated to keep the junction temperature below 125°C. Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operat- ing conditions for extended periods may affect product reliability. THERMAL RESISTANCE Thermal performance is directly linked to printed circuit board (PCB) design and operating environment. Close attention to PCB thermal design is required. θJA is the natural convection, junction to ambient thermal resistance measured in a one cubic foot sealed enclosure. θJC is measured at the top of the package and is independent of the PCB. The ΨJT value is appropriate for calculating junction to case temperature in the application. Table 8. Thermal Resistance Package Type θJA θJC ψJT Unit CP-41-11, 2, 3 50.4 33.1 25 °C/W 1 9 mm × 7 mm LFCSP with omitted pins for isolation purposes. 2 Thermal impedance simulated values are based on a JEDEC 2S2P thermal test board with 19 thermal vias. See JEDEC JESD-51. 3 Case temperature was measured at the center of the package. ELECTROSTATIC DISCHARGE (ESD) RATINGS The following ESD information is provided for handling of ESD-sen- sitive devices in an ESD protected area only. Human body model (HBM) per ANSI/ESDA/JEDEC JS-001. Field induced charged device model (FICDM) and charged device model (CDM) per ANSI/ESDA/JEDEC JS-002. ESD Ratings for ADP1034 Table 9. ADP1034, 41-Lead LFCSP ESD Model Withstand Threshold (V) Class HBM 3500 2 FICDM 1250 C3 ESD CAUTION ESD (electrostatic discharge) sensitive device. Charged devi- ces and circuit boards can discharge without detection. Although this product features patented or proprietary protection circuitry, damage may occur on devices subjected to high energy ESD. Therefore, proper ESD precautions should be taken to avoid performance degradation or loss of functionality. MAXIMUM CONTINUOUS WORKING VOLTAGE Table 10. Maximum Continuous Working Voltage1 Parameter Value Constraint 60 Hz AC Voltage 300 V rms 20-year lifetime at 0.1% failure rate, zero average voltage DC Voltage 424 V peak Limited by the creepage of the package, Pollution Degree 2, Material Group II2, 3 1 See the Insulation Lifetime section for more details. 2 Other pollution degree and material group requirements yield a different limit. 3 Some system level standards allow components to use the printed wiring board (PWB) creepage values. The supported dc voltage may be higher for those standards. |
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