STM32F405 datasheet(139/204 Pages) STMICROELECTRONICS

139 / 204 page

DS8626 Rev 9

139/203

STM32F405xx, STM32F407xx

Electrical characteristics

5.3.23

VBAT monitoring characteristics

5.3.24

Embedded reference voltage

The parameters given in Table 72 are derived from tests performed under ambient

temperature and VDD supply voltage conditions summarized in Table 14.

5.3.25

DAC electrical characteristics

Table 71. VBAT monitoring characteristics

Symbol

Parameter

Min

Typ

Max

Unit

Resistor bridge for VBAT

-50-

Ratio on VBAT measurement

Er(1)

Error on Q

–1

TS_vbat(2)(2)

ADC sampling time when reading the VBAT

1 mV accuracy

µs

1. Guaranteed by design.

2. Shortest sampling time can be determined in the application by multiple iterations.

Table 72. Embedded internal reference voltage

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VREFINT

Internal reference voltage

–40 °C < TA < +105 °C 1.18

1.21

1.24

TS_vrefint(1)

ADC sampling time when reading the

internal reference voltage

-10

µs

VRERINT_s(2)

Internal reference voltage spread over the

temperature range

VDD = 3 V

TCoeff(2)

Temperature coefficient

ppm/°C

tSTART(2)

Startup time

µs

1. Shortest sampling time can be determined in the application by multiple iterations.

2. Guaranteed by design.

Table 73. Internal reference voltage calibration values

Symbol

Parameter

Memory address

VREFIN_CAL

Raw data acquired at temperature of 30 °C, VDDA=3.3 V

0x1FFF 7A2A - 0x1FFF 7A2B

Table 74. DAC characteristics

Symbol

Parameter

Min

Typ

Max

Unit

Comments

VDDA

Analog supply voltage

1.8(1)

-3.6

VREF+

Reference supply voltage

1.8(1)

-3.6

VREF+ ≤ VDDA

VSSA

Ground

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