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L99LD21 数据表(PDF) 46 Page - STMicroelectronics

部件名 L99LD21
功能描述  High power LED driver for automotive applications
PDF  73 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

L99LD21 数据表(HTML) 46 Page - STMicroelectronics

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SPI functional description
L99LD21
46/73
DS11130 Rev 5
5.4.4
Customer test and trimming procedure description
General description
The writing procedure is performed connecting the two terminals of the anti-fuse capacitor
at 15 V and ground respectively. This is achieved by providing 15V on VS battery pin.
After this phase, the capacitor is burnt and behaves like a resistance; its value (the residual
resistance) strictly depends on the effectiveness of the burning procedure. During physical
reading operation, the residual resistance is compared with a fixed threshold. If the residual
resistance is greater than threshold a bit 0 is given, and the OTP cell is considered
unwritten, otherwise a bit 1 is given and the OTP cell is considered written.
Blank check reading is executed to verify that all anti-fuses are unwritten after fabrication,
while margin mode, usually performed immediately after the burning process, is used to
verify if burned cells are properly written. Executing a blank-check reading after all writing
operations have been completed allows verifying that unwritten cells haven’t been degraded
by burning processes.
Recommended test flow
In Figure 10 and in Table 28 the recommended testing procedure is shown and described.
Testing procedure starts with a blank check read, to verify that all anti-fuse rows are
unwritten. After this operation, it is possible to select the bits to be written and to start
programming. Writing operation should be performed up to 3 times. At the end of
programming, a reading procedure should be performed in Margin Mode.
At the end of the test, it is strongly recommended executing a blank-check read in order to
verify that unwritten cells haven’t been degraded.
Table 27 summarizes the writing test conditions.
Note:
An external capacitance must be applied between VS and GROUND pins.
Table 27. Writing test conditions
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VS
15 V supply
15
V
IHV
HV current during
programming
28
mA
Temperature
-40
27
150
°C
External capacitance
2
5
10
nF



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