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MPZ2012S221A 数据表(PDF) 7 Page - STMicroelectronics |
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MPZ2012S221A 数据表(HTML) 7 Page - STMicroelectronics |
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7 / 56 page ![]() Symbol Parameter Test conditions Min. Typ. Max. Unit VCLKIN_T (3) Synchronization pulse ON and OFF- time 2.3 ≤ VCLKIN_TH ≤ 2.5 V VCLKIN_TH = 2.3 V 60 ns Synchronization pulse ON and OFF- time VCLKIN_TH > 2.5 V 20 ns Power good VTHR PGOOD threshold - 40 °C ≤ TJ ≤ 125 °C (2) 87 90 93 % VTHR_HYST PGOOD hysteresis (QFN version only) 3 VPGOOD PGOOD open collector output VIN > VINH and VFB < VTH 4 mA sinking load 0.4 V 2 < VIN < VINH 4 mA sinking load 0.8 V TSHDWN (3) Thermal shutdown temperature 165 °C THYS (3) Thermal shutdown hysteresis 30 °C 1. Parameter tested in the static condition during testing phase. The parameter value may change over a dynamic application condition. 2. Specifications in the -40 to 125 °C temperature range are assured by characterization and statistical correlation. 3. Not tested in production. L6983I Electrical characteristics DS14040 - Rev 1 page 7/56 |
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