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DSP56321RM/D 数据表(PDF) 26 Page - NXP Semiconductors |
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DSP56321RM/D 数据表(HTML) 26 Page - NXP Semiconductors |
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26 / 88 page ![]() 2-2 Thermal Characteristics 2.3 Thermal Characteristics Table 2-1. Absolute Maximum Ratings Rating1 Symbol Value1, 2 Unit Supply Voltage3 VCCQL –0.1 to 2.25 V Input/Output Supply Voltage3 VCCQH 4 –0.3 to 4.35 V All input voltages VIN GND – 0.3 to VCCQH + 0.3 V Current drain per pin excluding VCCQL, VCCQH, and GND I10 mA Operating temperature range5 TJ 0 to +85 °C Storage temperature TSTG –55 to +150 °C Notes: 1. GND = 0 V, VCCQL = 1.6 V ± 0.1 V, VCCQH = 3.3 V ± 0.3 V, TJ = 0°C to +85°C, CL = 50 pF 2. Absolute maximum ratings are stress ratings only, and functional operation at the maximum is not guaranteed. Stress beyond the maximum rating may affect device reliability or cause permanent damage to the device. 3. Power-up sequence: During power-up, and throughout the DSP56321T operation, VCCQH voltage must always be higher or equal to VCCQL voltage. 4. VCCQH provides input power for VCCA, VCCD, VCCC, VCCH, and VCCS. These power blocks are isolated internally, but must be connected together externally. 5. Typically, this value implies a maximum ambient temperature (TA) of +70°C. Table 2-2. Thermal Characteristics Thermal Resistance Characteristic Symbol FC-PBGA Value Unit Junction-to-ambient, natural convection, single-layer board (1s)1,2 RθJA 50 °C/W Junction-to-ambient, natural convection, four-layer board (2s2p)1,3 RθJMA 28 °C/W Junction-to-ambient, @200 ft/min air flow, single-layer board (1s)1,3 RθJMA 37 °C/W Junction-to-ambient, @200 ft/min air flow, four-layer board (2s2p)1,3 RθJMA 23 °C/W Junction-to-board4 RθJB 13 °C/W Junction-to-case thermal resistance5 RθJC 0.1 °C/W Notes: 1. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. All values in this table are simulated; testing is not complete. 2. Per SEMI G38-87 and JEDEC JESD51-2 with the single-layer board horizontal. 3. Per JEDEC JESD51-6 with the board horizontal. 4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. 5. Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1) with the cold plate temperature used for the case temperature. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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