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L9963E 数据表(PDF) 132 Page - STMicroelectronics |
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L9963E 数据表(HTML) 132 Page - STMicroelectronics |
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132 / 184 page ![]() Figure 30. Recommended routing technique in order to reduce additional spikes due to lanes parasitic inductance Figure 31. Layout for ESD protections according to the recommended technique L9963E Layout recommendations DS13636 - Rev 12 page 132/184 |
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