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L9963E 数据表(PDF) 43 Page - STMicroelectronics |
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L9963E 数据表(HTML) 43 Page - STMicroelectronics |
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43 / 184 page  Symbol Parameter Test conditions Min. Typ. Max. Unit TCELL_SET_01 Settling time in respect to the first step of the Voltage Conversion Routine for balancing auto pause and VTREF dynamic enable Tested by SCAN 175 μs TCELL_SET_10 Settling time in respect to the first step of the Voltage Conversion Routine for balancing auto pause and VTREF dynamic enable Tested by SCAN 350 μs TCELL_SET_11 Settling time in respect to the first step of the Voltage Conversion Routine for balancing auto pause and VTREF dynamic enable Tested by SCAN 700 μs 1. The drift in spec accounts for the effects of both soldering and ageing. Post-soldering drift is provided on “as is” basis for information only and it has been evaluated on a limited population of 30 samples, hence subject to potential deviations. HTOL ageing was evaluated according to automotive qualification flow. 4.5 VBAT voltage measurement 4.5.1 Total battery voltage measurement A measurement of the total stack voltage is implemented in two ways: • By summing the single cell voltage during the Cell Conversion, thus obtaining VBATT_SUM, stored in Vsum_batt(19:0) • Directly converting the VBAT pin during VBAT Conversion, thus obtaining VBATT_MONITOR, stored in VBAT_DIV Both results can be read as: Stack voltage decoding VBATT_SUM=BINARY_CODE×VBATRES VBATTT_MONITOR=BINARY_CODE×VBATRES (3) Besides that, an independent analog comparator monitors the VBAT pin for fast UV/OV detection. Refer to Section 4.11.2 Total battery VBAT diagnostic for further information about diagnostics. 4.5.2 Electrical parameters All parameters are tested and guaranteed in the following conditions, unless otherwise noted: 9.6 V < VBAT < 64 V; -40 °C < Tambient < 105 °C; Shift between AGND, DGND, CGND, GNDREF below +/-100 mV Table 40. Stack voltage measurement electrical parameters Symbol Parameter Test conditions Min. Typ. Max. Unit VBATRES VBAT Voltage Measurement Resolution(1) Design info 70 V full scale input, obtained by sum of all cell voltages 89 μV VBAT_OV_SUM VBAT Over-voltage Fault Threshold(2) VBATT_SUM_OV_TH Tested by SCAN Related to sum of ADC (VBATT_SUM) 70.35 V VBAT_UV_SUM VBAT Under-voltage Fault Threshold(2) VBATT_SUM_UV_TH Tested by SCAN Related to sum of ADC (VBATT_SUM) 10 V VBAT_SUM_RES Stack voltage UV/OV resolution for Sum Of Cells Tested by SCAN 364.544 mV L9963E VBAT voltage measurement DS13636 - Rev 12 page 43/184 |
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