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L9963E 数据表(PDF) 42 Page - STMicroelectronics

部件名 L9963E
功能描述  Automotive Multicell battery monitoring and balancing IC
PDF  184 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

L9963E 数据表(HTML) 42 Page - STMicroelectronics

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Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
VCELL_NOISE1
TCYCLEADC = TCYCLEADC_000
0.1 V ≤ VCELL ≤ 5 V
-40 °C < TJ < 125 °C
600
μVrms
VCELL_NOISE2
TCYCLEADC = TCYCLEADC_001
0.1 V ≤ VCELL ≤ 5 V
-40 °C < TJ < 125 °C
400
μVrms
VCELL_NOISE3
TCYCLEADC = TCYCLEADC_010
0.1 V ≤ VCELL ≤ 5 V
-40 °C < TJ < 125 °C
200
μVrms
VCELL_NOISE4
TCYCLEADC = TCYCLEADC_011,
TCYCLEADC_100, TCYCLEADC_101,
TCYCLEADC_111
0.1 V ≤ VCELL ≤ 5 V
-40 °C < TJ < 125 °C
150
μVrms
TCYCLEADC_000
Conversion Time to Measure all cells
Tested by SCAN
290
µs
TCYCLEADC_001
Tested by SCAN
1.16
ms
TCYCLEADC_010
Tested by SCAN
2.32
ms
TCYCLEADC_011
Tested by SCAN
9.28
ms
TCYCLEADC_100
Tested by SCAN
18.56
ms
TCYCLEADC_101
Tested by SCAN
37.12
ms
TCYCLEADC_110
Tested by SCAN
74.24
ms
TCYCLEADC_111
Tested by SCAN
148.48
ms
VCELL_OV
Cell Over-voltage Fault Threshold
threshVcellOV
Application info, tested by
SCAN
0
5.80992
V
VCELL_OV_RES
Cell Over-voltage Fault Threshold
Resolution
Design info
22.784
mV
VCELL_UV
Cell Under-voltage Fault Threshold
threshVcellUV
Application info, tested by
SCAN
0
5.80992
V
VCELL_UV_RES
Cell Under-voltage Fault Threshold
Resolution
Design info
22.784
mV
VCELL_BAL_UV_Δ
Cell Balance Under-voltage Fault
Threshold
Vcell_bal_UV_delta_thr
Application info,
Tested by SCAN
0
5
V
VCELL_BAL_UV_RES
Cell Balance Under-voltage Fault
Threshold Resolution
Design info
22.784
mV
RLPF_OPEN
Equivalent open resistance in series to
Cn pin
Application info
4
KΩ
VCxOPEN
Cx open threshold for series resistor
Application info.
Maximum voltage drop on
the series resistor. To
prevent excessive leakage
from differential filtering
capacitor
Tested by SCAN
200
mV
IOPEN_DIAG_CX
Pulldown current used for cell open load
detection
For C1..14
40
50
60
μA
IOPEN_DIAG_C0
For C0
-60
-50
-40
μA
VADC_CROSS_FAIL
Critical mismatch between ADC results
causing cross-check failure
Tested by SCAN
20
mV
TCxOPEN_SET
Settling time for cell open diagnostics
Tested by SCAN
0.7
ms
L9963E
Cell voltage measurement
DS13636 - Rev 12
page 42/184



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