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L9963E 数据表(PDF) 182 Page - STMicroelectronics |
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L9963E 数据表(HTML) 182 Page - STMicroelectronics |
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182 / 184 page ![]() List of figures Figure 1. Typical application.................................................................. 4 Figure 2. Block diagram .................................................................... 5 Figure 3. Pin connections (top view) ............................................................ 6 Figure 4. Device operation in the VBAT supply voltage ranges ......................................... 10 Figure 5. Sketch of a 2s2p PCB with thermal vias .................................................. 12 Figure 6. Device functional states ............................................................. 14 Figure 7. Daisy chain addressing algorithm ...................................................... 16 Figure 8. Power up Sequence ............................................................... 17 Figure 9. Isolated SPI interface .............................................................. 23 Figure 10. Isolated SPI pulse shape and logical meaning ............................................. 24 Figure 11. Out of frame protocol description ...................................................... 27 Figure 12. Write and read access .............................................................. 27 Figure 13. Single read access ................................................................ 28 Figure 14. Burst access .................................................................... 29 Figure 15. False failure detection due to sudden heartbeat disable during the duty phase ....................... 39 Figure 16. Cell monitoring with Internal balancing ................................................... 47 Figure 17. Cell monitoring with external balancing with the mixed NMOS and PMOS transistors................... 47 Figure 18. Regular scheme .................................................................. 55 Figure 19. SPI timing diagram ................................................................ 63 Figure 20. Equivalent open resistance vs.cell voltage ................................................ 70 Figure 21. GPIO open resistance vs. temperature .................................................. 73 Figure 22. Voltage conversion routine ........................................................... 84 Figure 23. Routine execution modes: on-demand and cyclic executions ................................... 86 Figure 24. Equivalent FSM behavior of the voltage conversion routine .................................... 88 Figure 25. Example of routine execution in normal mode.............................................. 90 Figure 26. Example of configuration override: a failure detected during Cell Terminal diagnostics (yellow background) causes the following two steps (red background) to be executed ...................................... 93 Figure 27. Grounds collection node ........................................................... 129 Figure 28. Layout example of ground connections ................................................. 130 Figure 29. Example of best practice for splitting cell force and sense lines ................................. 131 Figure 30. Recommended routing technique in order to reduce additional spikes due to lanes parasitic inductance .... 132 Figure 31. Layout for ESD protections according to the recommended technique ............................ 132 Figure 32. Typical application circuit ........................................................... 133 Figure 33. Typical cell voltage sensing circuit ..................................................... 135 Figure 34. Fail Safe in case of open on busbar.................................................... 136 Figure 35. Typical current sensing analog front end ................................................ 136 Figure 36. VREG regulator circuits ............................................................ 137 Figure 37. Cell monitoring with internal balancing .................................................. 138 Figure 38. Cell monitoring with external balancing with the mixed NMOS and PMOS transistors.................. 139 Figure 39. FAULT link between daisy chained devices .............................................. 141 Figure 40. Recommended FAULT line design in a centralized BMS ..................................... 144 Figure 41. Transformer based ISO lines circuit .................................................... 145 Figure 42. Capacitive based ISO lines circuit ..................................................... 146 Figure 43. Example of NTC single ended measurement ............................................. 147 Figure 44. VNTC vs. temperature example (single ended measurement).................................. 148 Figure 45. Example of NTC differential measurement ............................................... 149 Figure 46. VNTC vs. temperature example (differential measurement) ................................... 150 Figure 47. How to handle unmounted cells ...................................................... 152 Figure 48. How to connect cell modules and busbar ................................................ 154 Figure 49. Distributed BMS ................................................................. 155 Figure 50. Centralized BMS................................................................. 156 Figure 51. Dual access ring ................................................................. 157 L9963E List of figures DS13636 - Rev 12 page 182/184 |
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