STR910FAM32 datasheet(72/101 Pages) STMICROELECTRONICS

72 / 101 page

Electrical characteristics

STR91xFAx3x, STR91xFAx4x

72/101

7.9.3

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

7.9.4

Electro-static discharge (ESD)

Electro-Static Discharges (3 positive then 3 negative pulses separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test

conforms to the JESD22-A114A/A115A standard. For more details, refer to the application

note AN1181.

7.9.5

Static latch-up

Two complementary static tests are required on 10 parts to assess the latch-up

performance.

●

A supply overvoltage (applied to each power supply pin) and

●

A current injection (applied to each input, output and configurable I/O pin) are

performed on each sample.

This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the

application note AN1181.

7.9.6

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

Software recommendations:

BGA and LQFP devices have similar EMI characteristics.

Table 29.

ESD data

Symbol

Ratings

Conditions

Class

Maximum

value (1)

Unit

VESD(HBM)

Electro-static discharge voltage

(Human Body Model)

TA=+25°C

conforming to

JESD22-A114

+/-2000

VESD(CDM)

Electro-static discharge voltage

(Charged Device Model)

TA=+25°C

conforming to

JESD22-C101

1000

Data based on characterization results, not tested in production.

STR910FAM32 数据表(PDF) 72 Page - STMicroelectronics

STR910FAM32 数据表(HTML) 72 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

数据表下载