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STR910FAM32 数据表(PDF) 73 Page - STMicroelectronics |
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STR910FAM32 数据表(HTML) 73 Page - STMicroelectronics |
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73 / 101 page ![]() STR91xFAx3x, STR91xFAx4x Electrical characteristics 73/101 The software flowchart must include the management of runaway conditions such as: ● Corrupted program counter ● Unexpected reset ● Critical Data corruption (control registers...) Prequalification trials: Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1 second. To complete these trials, ESD stress can be applied directly on the device, over the range of specification values. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note AN1015). 7.9.7 Electrical sensitivity Table 30. Static latch-up data Symbol Parameter Conditions Class (1) 1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the JEDEC criteria (international standard). LU Static latch-up class TA=+25°C conforming to JESD78A II class A |
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