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STM8L151C4 数据表(PDF) 74 Page - STMicroelectronics

部件名 STM8L151C4
功能描述  8-bit ultralow power MCU, up to 32 KB Flash, 1 KB Data EEPROM RTC, LCD, timers, USART, I2C, SPI, ADC, DAC, comparators
PDF  101 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM8L151C4 数据表(HTML) 74 Page - STMicroelectronics

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Electrical parameters
STM8L151xx, STM8L152xx
74/101
Doc ID 15962 Rev 2
8.3.6
I/O port pin characteristics
General characteristics
Subject to general operating conditions for VDD and TA unless otherwise specified. All
unused pins must be kept at a fixed voltage: using the output mode of the I/O for example or
an external pull-up or pull-down resistor.
Table 32.
I/O static characteristics (1)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIL
Input low level voltage(2)
Input voltage on true
open-drain pins (PC0
and PC1)
VSS -0.3
0.3 x VDD
V
Input voltage on FT
pins (PA7 and PE0)
VSS -0.3
0.3 x VDD
Input voltage on any
other pin
VSS -0.3
0.3 x VDD
VIH
Input high level voltage (2)
Input voltage on true
open-drain pins (PC0
and PC1)
0.70 x VDD
VDD+3.6
V
Input voltage on FT
pins (PA7 and PE0)
0.70 x VDD
VDD+3.6
Input voltage on any
other pin
0.70 x VDD
VDDmax+0.3
Vhys
Schmitt trigger voltage hysteresis (3)
Standard I/Os
200
mV
True open drain I/Os
250
Ilkg
Input leakage current (4)
VSSVINVDD
Standard I/Os
--
50 (5)
nA
VSSVINVDD
True open drain I/Os
-
-
200(5)
VSSVINVDD
PA0 with high sink LED
driver capability
-
-
200(5)
RPU
Weak pull-up equivalent resistor(6)
VIN=VSS
30
45
60
k
Ω
CIO
(7)
I/O pin capacitance
5
pF
1.
VDD = 3.0 V, TA = -40 to 125 °C unless otherwise specified.
2.
Data based on characterization results, not tested in production.
3.
Hysteresis voltage between Schmitt trigger switching levels. Based on characterization results, not tested.
4.
The max. value may be exceeded if negative current is injected on adjacent pins.
5.
Not tested in production.
6.
RPU pull-up equivalent resistor based on a resistive transistor.
7.
Data guaranteed by Design, not tested in production.



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