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STM32F303VC 数据表(PDF) 110 Page - STMicroelectronics |
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STM32F303VC 数据表(HTML) 110 Page - STMicroelectronics |
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110 / 133 page ![]() Electrical characteristics STM32F302xx/STM32F303xx 110/133 Doc ID 023353 Rev 5 Figure 32. ADC accuracy characteristics SINAD Signal-to- noise and distortion ratio ADC clock freq. ≤ 72 MHz, Sampling freq. ≤ 5 Msps, 2V ≤ VDDA , VREF+ ≤ 3.6 V Single Ended Fast channel 5.1 Ms - 63 dB Slow channel 4.8 Ms - 63 Differential Fast channel 5.1 Ms - 67 Slow channel 4.8 Ms - 67 SNR Signal-to- noise ratio Single Ended Fast channel 5.1 Ms 64 - Slow channel 4.8 Ms 64 - Differential Fast channel 5.1 Ms 67 - Slow channel 4.8 Ms 67 - THD Total harmonic distortion Single Ended Fast channel 5.1 Ms - −71 Slow channel 4.8 Ms - −69 Differential Fast channel 5.1 Ms - −73 Slow channel 4.8 Ms - −70 1. ADC DC accuracy values are measured after internal calibration. 2. ADC accuracy vs. negative Injection Current: Injecting negative current on any analog input pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject negative current. Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.14 does not affect the ADC accuracy. 3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges. 4. Data based on characterization results, not tested in production. Table 69. ADC accuracy (1)(2)(3) (continued) Symbol Parameter Conditions Min (4) Max(4) Unit EO EG 1LSBIDEAL (1) Example of an actual transfer curve (2) The ideal transfer curve (3) End point correlation line ET=Total Unadjusted Error: maximum deviation between the actual and the ideal transfer curves. EO=Offset Error: deviation between the first actual transition and the first ideal one. EG=Gain Error: deviation between the last ideal transition and the last actual one. ED=Differential Linearity Error: maximum deviation between actual steps and the ideal one. EL=Integral Linearity Error: maximum deviation between any actual transition and the end point correlation line. 4095 4094 4093 5 4 3 2 1 0 7 6 1 2 3 456 7 4093 4094 4095 4096 (1) (2) ET ED EL (3) VDDA VSSA ai14395b VREF+ 4096 (or depending on package)] VDDA 4096 [1LSBIDEAL = |
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