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THS8083APZP 数据表(PDF) 49 Page - Texas Instruments |
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THS8083APZP 数据表(HTML) 49 Page - Texas Instruments |
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49 / 64 page ![]() 5–5 5.4.5.2 Dynamic Performance† PARAMETER TEST CONDITIONS MIN TYP MAX UNIT PARAMETER ADC_INTREF MIN TYP MAX UNIT Effective number of bits, ENOB (from SNR) fI = 20 MHz 6.7 Bits Signal-to-total ratio without distortion, SNR fI = 20 MHz 42 dB Total harmonic distortion, THD fI = 1 MHz –49 dB Spurious free dynamic range, SFDR fI = 1 MHz 52 dB Analog input full-power bandwidth, BW (see Note 11) 500 MHz † Based on analog input voltage of 1 dB FS referenced to the full-scale input range and a clock signal with 50% duty cycle NOTE 11: Analog input bandwidth—The analog input bandwidth is defined as the maximum frequency of the input sine that can be applied to the device for which a 3 dB attenuation is observed in the reconstructed signal. 5.4.5.3 Clamp PARAMETER TEST CONDITIONS MIN TYP MAX UNIT PARAMETER ADC_INTREF MIN TYP MAX UNIT Clamp code adjustment range See Note 12 100 138 LSB Clamp code adjustment range See Note 12 100 138 LSB Clamp acquisition time at input dc level change Input level changed by Within 10% of final value 1 ms Clamp acquisition time at input dc level change In ut level changed by 100 mV Within 1 LSB of final value 2.4 ms Clamp acquisition time, clamp code change Clamp changed from minimum to maximum Within 1 LSB 500 1000 ns Clamp droop error Droop between 2 clamps at 15 kHz line rate 05 16 LSB Clamp droop error Droop between 2 clamps at 15 kHz line rate 0.5 1.6 LSB NOTE 12: Clamp code adjustment range—A dc-input signal is applied to the device. The clamp code is changed from minimum to maximum setting. The corresponding change in the ADC output code is defined as the clamp code adjustment range. 5.4.6 Coarse PGA PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Full-scale adjustment range 0.4 1.2 V Accuracy ± 6 LSB 5.4.7 Fine PGA PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Full-scale adjustment range –4 8 LSB |
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