SPC560P60L3 datasheet(48/104 Pages) STMICROELECTRONICS

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Electrical characteristics

SPC56xP54x, SPC56xP60x

48/104

Doc ID 18340 Rev 3

Electrical characteristics

3.1

Introduction

This section contains electrical characteristics of the device as well as temperature and

power considerations.

This product contains devices to protect the inputs against damage due to high static

voltages. However, it is advisable to take precautions to avoid application of any voltage

higher than the specified maximum rated voltages.

To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD

or VSS). This can be done by the internal pull-up or pull-down, which is provided by the

product for most general purpose pins.

The parameters listed in the following tables represent the characteristics of the device and

its demands on the system.

In the tables where the device logic provides signals with their respective timing

characteristics, the symbol “CC” for Controller Characteristics is included in the Symbol

column.

In the tables where the external system must provide signals with their respective timing

characteristics to the device, the symbol “SR” for System Requirement is included in the

Symbol column.

Caution:

All of the following parameter values can vary depending on the application and must be

confirmed during silicon validation, silicon characterization or silicon reliability trial.

3.2

Parameter classification

The electrical parameters shown in this supplement are guaranteed by various methods. To

give the customer a better understanding, the classifications listed in Table 8 are used and

the parameters are tagged accordingly in the tables where appropriate.

Note:

The classification is shown in the column labeled “C” in the parameter tables where

appropriate.

Table 8.

Parameter classifications

Classification tag

Tag description

Those parameters are guaranteed during production testing on each individual device.

Those parameters are achieved by the design characterization by measuring a statistically

relevant sample size across process variations.

Those parameters are achieved by design characterization on a small sample size from typical

devices under typical conditions unless otherwise noted. All values shown in the typical

column are within this category.

Those parameters are derived mainly from simulations.

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