S12OSCV2D datasheet(101/126 Pages) FREESCALE

部件名	S12OSCV2D

功能描述	MC9S12DJ64 Device User GUide V01.17

PDF	126 Pages

Scroll/Zoom	100%

制造商	FREESCALE [Freescale Semiconductor, Inc]

网页	http://www.freescale.com

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MC9S12DJ64 Device User Guide — V01.17

101

A.3.2 NVM Reliability

The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process

monitors and burn-in to screen early life failures.

The failure rates for data retention and program/erase cycling are specified at the operating conditions

noted.

The program/erase cycle count on the sector is incremented every time a sector or mass erase event is

executed.

Table A-12 NVM Reliability Characteristics

Conditions are shown in Table A-4 unless otherwise noted

Num C

Rating

Symbol

Min

Typ

Max

Unit

Data Retention at an average junction temperature of

TJavg = 70°C

tNVMRET

Years

C Flash number of Program/Erase cycles

nFLPE

10,000

Cycles

EEPROM number of Program/Erase cycles

(–40

°C

≤ T

J ≤ 0°C)

nEEPE

10,000

Cycles

EEPROM number of Program/Erase cycles

°C < T

J ≤ 140°C)

nEEPE

100,000

Cycles

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