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28F004SC 数据表(PDF) 37 Page - Intel Corporation |
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28F004SC 数据表(HTML) 37 Page - Intel Corporation |
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37 / 42 page ![]() E BYTE-WIDE SmartVoltage FlashFile™ MEMORY FAMILY 37 PRELIMINARY 6.6 AC Characteristics—Write Operations(1,2)—Commercial Temperature TA = 0°C to +70°C 5 V ± 5%, 5 V ± 10% VCC Valid for All Speeds Versions 3.3 V ± 0.3 V, 2.7 V −3.6 V VCC Valid for All Speeds Unit # Sym Parameter Notes Min Max Min Max W1 tPHWL (tPHEL) RP# High Recovery to WE# (CE#) Going Low 31 1µs W2 tELWL (tWLEL) CE# (WE#) Setup to WE# (CE#) Going Low 70 0ns W3 tWP Write Pulse Width 7 50 70 ns W4 tDVWH (tDVEH) Data Setup to WE# (CE#) Going High 4 40 50 ns W5 tAVWH (tAVEH) Address Setup to WE# (CE#) Going High 4 40 50 ns W6 tWHEH (tEHWH) CE# (WE#) Hold from WE# (CE#) High 0 0ns W7 tWHDX (tEHDX) Data Hold from WE# (CE#) High 5 5ns W8 tWHAX (tEHAX) Address Hold from WE# (CE#) High 5 5ns W9 tWPH Write Pulse Width High 9 25 25 ns W10 tPHHWH (tPHHEH) RP# VHH Setup to WE# (CE#) Going High 3,8 100 100 ns W11 tVPWH (tVPEH)VPP Setup to WE# (CE#) Going High 3,8 100 100 ns W12 tWHGL (tEHGL) Write Recovery before Read 0 0ns W13 tWHRL (tEHRL) WE# (CE#) High to RY/BY# Going Low 8 90 90 ns W14 tQVPH RP# VHH Hold from Valid SRD, RY/BY# High 3,5,8 0 0ns W15 tQVVL VPP Hold from Valid SRD, RY/BY# High 3,5,8 0 0ns NOTES: 1. Read timing characteristics during block erase, program, and lock-bit configuration operations are the same as during read-only operations. Refer to AC Characteristics for read-only operations. 2. A write operation can be initiated and terminated with either CE# or WE#. 3. Sampled, not 100% tested. 4. Refer to Table 4 for valid AIN and DIN for block erase, program, or lock-bit configuration. 5. VPP should be held at VPPH1/2/3 (and if necessary RP# should be held at VHH) until determination of block erase, program, or lock-bit configuration success (SR.1/3/4/5 = 0). 6. See Ordering Information for device speeds (valid operational combinations). 7. Write pulse width (tWP) is defined from CE# or WE# going low (whichever goes low last) to CE# or WE# going high (whichever goes high first). Hence, tWP = tWLWH = tELEH = tWLEH = tELWH. If CE# is driven low 10 ns before WE# going low, WE# pulse width requirement decreases to tWP – 10 ns for 5 V VCC and tWP – 20 ns for 2.7 V and 3.3 V VCC writes. 8. Block erase, program, and lock-bit configuration with VCC < 3.0 V should not be attempted. 9. Write pulse width high (tWPH) is defined from CE# or WE# going high (whichever goes high first) to CE# or WE# going low (whichever goes low last). Hence, tWPH = tWHWL = tEHEL = tWHEL = tEHWL. |
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