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MPC5633MMLL60 数据表(PDF) 67 Page - Freescale Semiconductor, Inc |
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MPC5633MMLL60 数据表(HTML) 67 Page - Freescale Semiconductor, Inc |
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67 / 106 page ![]() MPC5634M Microcontroller Data Sheet, Rev. 8 Freescale Semiconductor 67 4.3 Thermal characteristics 8 AC signal overshoot and undershoot of up to 2.0 V of the input voltages is permitted for an accumulative duration of 60 hours over the complete lifetime of the device (injection current not limited for this duration). 9 Internal structures hold the voltage greater than –1.0 V if the injection current limit of 2 mA is met. 10 Internal structures hold the input voltage less than the maximum voltage on all pads powered by V DDEH supplies, if the maximum injection current specification is met (2 mA for all pins) and VDDEH is within the operating voltage specifications. 11 Internal structures hold the input voltage less than the maximum voltage on all pads powered by V DDE supplies, if the maximum injection current specification is met (2 mA for all pins) and VDDE is within the operating voltage specifications. 12 Total injection current for all pins (including both digital and analog) must not exceed 25 mA. 13 Total injection current for all analog input pins must not exceed 15 mA. 14 Lifetime operation at these specification limits is not guaranteed. 15 Solder profile per CDF-AEC-Q100. 16 Moisture sensitivity per JEDEC test method A112. Table 9. Thermal characteristics for 144-pin LQFP Symbol C Parameter Conditions Value Unit RJA CC D Junction-to-Ambient, Natural Convection1 1 Junction-to-Ambient Thermal Resistance determined per JEDEC JESD51-3 and JESD51-6. Thermal test board meets JEDEC specification for this package. Single layer board – 1s 43 °C/W RJA CC D Junction-to-Ambient, Natural Convection2 Four layer board – 2s2p 35 °C/W RJMA CC D Junction-to-Ambient (@200 ft/min)2 Single layer board –1s 34 °C/W RJMA CC D Junction-to-Ambient (@200 ft/min)2 Four layer board – 2s2p 29 °C/W RJB CC D Junction-to-Board2 2 Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for the specified package. 22 °C/W RJCtop CC D Junction-to-Case (Top)3 3 Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is used for the case temperature. Reported value includes the thermal resistance of the interface layer. 8°C/W JT CC D Junction-to-Package Top, Natural Convection4 4 Thermal characterization parameter indicating the temperature difference between the package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT. 2°C/W |
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