MPC5601PEF0MLL4R datasheet(33/95 Pages) FREESCALE

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MPC5602P Microcontroller Data Sheet, Rev. 4.1

Freescale Semiconductor

Electrical characteristics

3.1

Introduction

This section contains device electrical characteristics as well as temperature and power considerations.

This microcontroller contains input protection against damage due to high static voltages. However, it is advisable to take

precautions to avoid application of any voltage higher than the specified maximum rated voltages.

To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD or VSS). This can be done by the

internal pull-up or pull-down resistors, which are provided by the device for most general purpose pins.

The following tables provide the device characteristics and its demands on the system.

In the tables where the device logic provides signals with their respective timing characteristics, the symbol “CC” for Controller

Characteristics is included in the Symbol column.

In the tables where the external system must provide signals with their respective timing characteristics to the device, the symbol

“SR” for System Requirement is included in the Symbol column.

CAUTION

All of the following parameter values can vary depending on the application and must be

confirmed during silicon characterization or silicon reliability trial.

3.2

Parameter classification

The electrical parameters are guaranteed by various methods. To give the customer a better understanding, the classifications

listed in Table 6 are used and the parameters are tagged accordingly in the tables where appropriate.

NOTE

The classification is shown in the column labeled “C” in the parameter tables where

appropriate.

3.3

Absolute maximum ratings

Table 6. Parameter classifications

Classification tag

Tag description

Those parameters are guaranteed during production testing on each individual device.

Those parameters are achieved by the design characterization by measuring a statistically

relevant sample size across process variations.

Those parameters are achieved by design characterization on a small sample size from typical

devices under typical conditions unless otherwise noted. All values shown in the typical column

are within this category.

Those parameters are derived mainly from simulations.

Table 7. Absolute maximum ratings1

Symbol

Parameter

Conditions

Value

Unit

Min

Max

VSS

SR Device ground

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