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数据搜索系统，热门电子元器件搜索 |
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数据搜索系统，热门电子元器件搜索 |
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RA4M3 数据表(PDF) 77 Page - Renesas Technology Corp |
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RA4M3 数据表(HTML) 77 Page - Renesas Technology Corp |
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77 / 92 page  VCC RES Boundary scan execute tBSSTUP (= tRESWP) Figure 2.65 Boundary scan circuit startup timing 2.14 Joint European Test Action Group (JTAG) Table 2.50 JTAG Parameter Symbol Min Typ Max Unit Test conditions TCK clock cycle time tTCKcyc 40 — — ns Figure 2.66 TCK clock high pulse width tTCKH 15 — — ns TCK clock low pulse width tTCKL 15 — — ns TCK clock rise time tTCKr — — 5 ns TCK clock fall time tTCKf — — 5 ns TMS setup time tTMSS 8 — — ns Figure 2.67 TMS hold time tTMSH 8 — — ns TDI setup time tTDIS 8 — — ns TDI hold time tTDIH 8 — — ns TDO data delay time tTDOD — — 20 ns TCK tTCKH tTCKcyc tTCKL tTCKf tTCKr Figure 2.66 JTAG TCK timing RA4M3 Datasheet 2. Electrical Characteristics R01DS0368EJ0120 Rev.1.20 Dec 2, 2020 Page 77 of 92 |
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