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MCP48FVB21 数据表(PDF) 80 Page - Microchip Technology |
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MCP48FVB21 数据表(HTML) 80 Page - Microchip Technology |
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80 / 84 page ![]() MCP48FVBXX DS20005466A-page 80 2015 Microchip Technology Inc. B.13 Settling Time Settling time is the time delay required for the VOUT voltage to settle into its new output value. This time is measured from the start of code transition to when the VOUT voltage is within the specified accuracy. In the MCP48FVBXX, the settling time is a measure of the time delay until the VOUT voltage reaches within 0.5 LSb of its final value, when the volatile DAC Register changes from 1/4 to 3/4 of the full-scale range (12-bit device: 400h to C00h). B.14 Major-Code Transition Glitch Major-Code transition glitch is the impulse energy injected into the DAC analog output when the code in the DAC register changes state. It is normally specified as the area of the glitch in nV-Sec, and is measured when the digital code is changed by 1 LSb at the major carry transition. B.15 Digital Feedthrough Digital feedthrough is the glitch that appears at the analog output, caused by coupling from the digital input pins of the device. The area of the glitch is expressed in nV-Sec, and is measured with a full-scale change on the digital input pins. Example: all 0s to all 1s and vice versa. The digital feedthrough is measured when the DAC is not being written to the output register. B.16 -3 dB Bandwidth This is the frequency of the signal at the VREF pin that causes the voltage at the VOUT pin to fall -3 dB value from a static value on the VREF pin. The output decreases due to the RC characteristics of the resistor ladder and the characteristics of the output buffer. B.17 Power-Supply Sensitivity (PSS) PSS indicates how the output of the DAC is affected by changes in the supply voltage. PSS is the ratio of the change in VOUT to a change in VDD for mid-scale output of the DAC. The VOUT is measured while the VDD is varied from 5.5V to 2.7V as a step (VREF voltage held constant), and expressed in %/%, which is the % change of the DAC output voltage with respect to the % change of the VDD voltage. EQUATION B-8: PSS CALCULATION B.18 Power-Supply Rejection Ratio (PSRR) PSRR indicates how the output of the DAC is affected by changes in the supply voltage. PSRR is the ratio of the change in VOUT to a change in VDD for full-scale output of the DAC. The VOUT is measured while the VDD is varied ± 10% (VREF voltage held constant), and expressed in dB or µV/V. B.19 VOUT Temperature Coefficient The VOUT Temperature Coefficient quantifies the error in the resistor ladder’s resistance ratio (DAC Register code value) and Output Buffer due to temperature drift. B.20 Absolute Temperature Coefficient The absolute temperature coefficient quantifies the error in the end-to-end output voltage (Nominal output voltage VOUT) due to temperature drift. For a DAC this error is typically not an issue due to the ratiometric aspect of the output. B.21 Noise Spectral Density Noise spectral density is a measurement of the device’s internally-generated random noise, and is characterized as a spectral density (voltage per √Hz). It is measured by loading the DAC to the mid-scale value and measuring the noise at the VOUT pin. It is measured in nV/√Hz. Example: 011...111 to 100...000 or 100...000 to 011...111 Where: PSS is expressed in %/%. VOUT(@5.5V) = The measured DAC output voltage with VDD = 5.5V. VOUT(@2.7V) = The measured DAC output voltage with VDD = 2.7V. PSS V OUT @5.5V VOUT @2.7V – V OUT @5.5V ----------------------------------------------------------------------------------- 5.5V 2.7V – 5.5V --------------------------------- ----------------------------------------------------------------------------------- = |
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