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MCP48FVB21 数据表(PDF) 80 Page - Microchip Technology

部件名 MCP48FVB21
功能描述  8-/10-/12-Bit Single/Dual Voltage Output Volatile Digital-to-Analog Converters with SPI Interface
PDF  84 Pages
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制造商  MICROCHIP [Microchip Technology]
网页  http://www.microchip.com
标志 MICROCHIP - Microchip Technology

MCP48FVB21 数据表(HTML) 80 Page - Microchip Technology

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MCP48FVBXX
DS20005466A-page 80
 2015 Microchip Technology Inc.
B.13
Settling Time
Settling time is the time delay required for the VOUT
voltage to settle into its new output value. This time is
measured from the start of code transition to when the
VOUT voltage is within the specified accuracy.
In the MCP48FVBXX, the settling time is a measure of
the time delay until the VOUT voltage reaches within
0.5 LSb of its final value, when the volatile DAC
Register changes from 1/4 to 3/4 of the full-scale range
(12-bit device: 400h to C00h).
B.14
Major-Code Transition Glitch
Major-Code transition glitch is the impulse energy
injected into the DAC analog output when the code in
the DAC register changes state. It is normally specified
as the area of the glitch in nV-Sec, and is measured
when the digital code is changed by 1 LSb at the major
carry transition.
B.15
Digital Feedthrough
Digital feedthrough is the glitch that appears at the
analog output, caused by coupling from the digital input
pins of the device. The area of the glitch is expressed
in nV-Sec, and is measured with a full-scale change on
the digital input pins.
Example: all 0s to all 1s and vice versa.
The digital feedthrough is measured when the DAC is
not being written to the output register.
B.16
-3 dB Bandwidth
This is the frequency of the signal at the VREF pin that
causes the voltage at the VOUT pin to fall -3 dB value
from a static value on the VREF pin. The output
decreases due to the RC characteristics of the resistor
ladder and the characteristics of the output buffer.
B.17
Power-Supply Sensitivity (PSS)
PSS indicates how the output of the DAC is affected by
changes in the supply voltage. PSS is the ratio of the
change in VOUT to a change in VDD for mid-scale output
of the DAC. The VOUT is measured while the VDD is
varied from 5.5V to 2.7V as a step (VREF voltage held
constant), and expressed in %/%, which is the
% change of the DAC output voltage with respect to the
% change of the VDD voltage.
EQUATION B-8:
PSS CALCULATION
B.18
Power-Supply Rejection Ratio
(PSRR)
PSRR indicates how the output of the DAC is affected
by changes in the supply voltage. PSRR is the ratio of
the change in VOUT to a change in VDD for full-scale
output of the DAC. The VOUT is measured while the
VDD is varied ± 10% (VREF voltage held constant), and
expressed in dB or µV/V.
B.19
VOUT Temperature Coefficient
The VOUT Temperature Coefficient quantifies the error
in the resistor ladder’s resistance ratio (DAC Register
code value) and Output Buffer due to temperature drift.
B.20
Absolute Temperature Coefficient
The absolute temperature coefficient quantifies the
error in the end-to-end output voltage (Nominal output
voltage VOUT) due to temperature drift. For a DAC this
error is typically not an issue due to the ratiometric
aspect of the output.
B.21
Noise Spectral Density
Noise spectral density is a measurement of the
device’s internally-generated random noise, and is
characterized as a spectral density (voltage per √Hz).
It is measured by loading the DAC to the
mid-scale value and measuring the noise at the
VOUT pin. It is measured in nV/√Hz.
Example: 011...111 to 100...000
or 100...000 to 011...111
Where:
PSS is expressed in %/%.
VOUT(@5.5V) = The measured DAC output
voltage with VDD = 5.5V.
VOUT(@2.7V) = The measured DAC output
voltage with VDD = 2.7V.
PSS
V
OUT @5.5V
 VOUT @2.7V

V
OUT @5.5V

-----------------------------------------------------------------------------------
5.5V
2.7V

5.5V
---------------------------------
-----------------------------------------------------------------------------------
=



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