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ADIN1110BCPZ-R7 数据表(PDF) 29 Page - Analog Devices

部件名 ADIN1110BCPZ-R7
功能描述  Robust, Industrial, Low Power 10BASE-T1L Ethernet MAC-PHY
PDF  107 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADIN1110BCPZ-R7 数据表(HTML) 29 Page - Analog Devices

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Data Sheet
ADIN1110
APPLICATIONS INFORMATION
analog.com
Rev. B | 29 of 107
Internal free-running counter
Syntonized counter
Waveform generation on TS_TIMER output
Internal Free Running Counter
The ADIN1110 has an internal free running counter running at 120
MHz. This counter provides an accuracy of 8.333 ns. When using
this counter, there is a period of approximately 35 s. This period
ensures that the clock does not wrap during any of the necessary
operations, for example, between receipt of peer delay request and
transmission of the response.
To enable the free running counter, the TS_EN bits must be set to
1.
When the free running counter is enabled, the ADIN1110 captures
the time stamp for all received frames, and it is appended before
each data frame received. The time stamps of transmitted frames
are captured when requested. See Time Stamp Capture for more
details.
The value of the free running counter can be captured using the
input capture signal (TS_CAPT), capturing the value of the counter
in the TS_FREECNT_CAPT register.
Syntonized Counter
The syntonized counter is a 64-bit counter in which the lower 32
bits represent nanoseconds with 1 LSB = 1 ns. When the lower 32
bits reach the value stored in TS_1SEC_CMP, these bits clear and
the upper 32 bits increment representing seconds.
To enable the syntonized counter, the TS_EN bits must be set to 1.
Three modes are supported for capturing time stamps for transmit-
ted and received frames, as follows:
1. Capture a 2-bit sec and a 30-bit ns time stamp as defined in the
OPEN Alliance Specification Section 7.8. See the Configuration
Register 0 section.
2. Capture a 32-bit sec and a 30-bit ns time stamp as defined in
the OPEN Alliance Specification Section 7.8. See the Configu-
ration Register 0 section.
3. Capture the 32-bit free running counter. See the Timer Configu-
ration Register section.
To enable capturing of time stamps for transmitted and received
frames, set FTSE (CONFIG0 register) to 1.
Waveform Generation on TS_TIMER Output
The ADIN1110 can generate an output signal (TS_TIMER) that
uses two counters to generate repeating waveforms driven by the
syntonized time. These two counters, TS_TIMER_HI and TS_TIM-
ER_LO, specify the high and low period of the TS_TIMER signal
and need to be programmed with multiples of 16 because they are
driven by the syntonized time.
Because it is frequent that the required period of TS_TIMER cannot
be programmed as a multiple of 16, the quantization error correc-
tion register can be programmed with a value between 0 and 15 to
compensate for the TS_TIMER quantization error.
It is possible to specify a time with respect to the 64-bit synton-
ized timer to start the generation of the TS_TIMER output. The
TS_TIMER_START register can be programmed with a value that is
compared with the nanoseconds portion of the syntonized counter
to generate a one-shot start.
The sequence to enable the TS_TIMER output is as follows:
1. If required, change the default value of the TS_TIMER output
from 0 to 1 by writing to the TS_TIMER_DEF bits.
2. Write the values required for the high and low times for the
TS_TIMER output to the TS_TIMER_HI and TS_TIMER_LO
registers.
3. Write the value required for the quantization error correction to
the TS_TIMER_QE_CORR register.
4. Write a start time to the TS_TIMER_START registers. When the
nanoseconds part of the syntonized counter matches this value,
TS_TIMER starts toggling.
The TS_TIMER output can be stopped by writing 1 to the TS_TIM-
ER_STOP bits. When the TS_TIMER output is stopped, the output
goes back to the default value specified in TS_TIMER_DEF.
ELECTROMAGNETIC COMPATIBILITY (EMC)
AND ELECTROMAGNETIC IMMUNITY (EMI)
The ADIN1110 was tested at the system level for EMC and EMI.
Table 21 summarizes the results.
Table 21. EMC/EMI Tests Conducted on ADIN1110 at System Level
EMC/EMI Test
Withstand Threshold
IEC 61000-4-4 Electrical Fast Transient (EFT)
±4 kV
IEC 61000-4-2 ESD (Contact Discharge)
±4 kV
IEC 61000-4-2 ESD (Air Discharge)
±8 kV
IEC 61000-4-5 Surge
±4 kV
IEC 61000-4-6 Conducted Immunity
10 V/m
IEC 61000-4-3 Radiated Immunity
Class A
EN 55032 Radiated Emissions
Class B



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