H8SSLASH2218 datasheet(499/750 Pages) RENESAS

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Section 13 Boundary Scan Function

Rev.6.00 Jun. 03, 2008 Page 451 of 698

REJ09B0074-0600

13.2

Pin Configuration

Table 13.1 shows the I/O pins used in the boundary scan function.

Table 13.1

Pin Configuration

Pin Name

I/O

Function

TMS

Input

Test Mode Select

Controls the TAP controller which is a 16-state Finite State

Machine.

The TMS input value at the rising edge of TCK determines the

status transition direction on the TAP controller.

The TMS is fixed high when the boundary scan function is not

used.

The protocol is based on JTAG standard (IEEE Std.1149.1).

This pin has a pull-up resistor.

TCK

Input

Test Clock

A clock signal for the boundary scan function.

When the boundary scan function is used, input a clock of

50% duty to this pin.

This pin has a pull-up resistor.

TDI

Input

Test Data Input

A data input signal for the boundary scan function.

Data input from the TDI is latched at the rising edge of TCK.

TDI is fixed high when the boundary scan function is not used.

This pin has a pull-up register.

TDO

Output

Test Data Output

A data output signal for the boundary scan function. Data

output from the TDO changes at the falling edge of TCK. The

output driver of the TDO is driven only when it is necessary

only in Shift-IR or Shift-DR states, and is brought to the high-

impedance state when not necessary.

TRST

Input

Test Reset

Asynchronously resets the TAP controller when

TRST is

brought low.

The user must apply power-on reset signal specific to the

boundary scan function when the power is supplied. (For

details on signal design, refer to section 13.5, Usage Notes.)

This pin has a pull-up resister.

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