MFRC522 datasheet(35/96 Pages) NXP

35 / 96 page

MFRC522_33

Product data sheet

PUBLIC

Rev. 3 — 26 October 2009

112133

35 of 96

NXP Semiconductors

MFRC522

Contactless reader IC

21h

CRCResultReg

shows the MSB and LSB values of the CRC calculation

Table 87 on page 54

22h

Table 89 on page 54

23h

Reserved

reserved for future use

Table 91 on page 55

24h

ModWidthReg

controls the ModWidth setting

Table 93 on page 55

25h

Reserved

reserved for future use

Table 95 on page 55

26h

RFCfgReg

conﬁgures the receiver gain

Table 97 on page 56

27h

GsNReg

selects the conductance of the antenna driver pins TX1 and

TX2 for modulation

Table 99 on page 56

28h

CWGsPReg

deﬁnes the conductance of the p-driver output during

periods of no modulation

Table 101 on page 57

29h

ModGsPReg

deﬁnes the conductance of the p-driver output during

periods of modulation

Table 103 on page 57

2Ah

TModeReg

deﬁnes settings for the internal timer

Table 105 on page 57

2Bh

TPrescalerReg

Table 107 on page 58

2Ch

TReloadReg

deﬁnes the 16-bit timer reload value

Table 109 on page 59

2Dh

Table 111 on page 59

2Eh

TCounterValReg

shows the 16-bit timer value

Table 113 on page 59

2Fh

Table 115 on page 59

Page 3: Test register

30h

Reserved

reserved for future use

Table 117 on page 60

31h

TestSel1Reg

general test signal conﬁguration

Table 119 on page 60

32h

TestSel2Reg

general test signal conﬁguration and PRBS control

Table 121 on page 60

33h

TestPinEnReg

enables pin output driver on pins D1 to D7

Table 123 on page 61

34h

TestPinValueReg

deﬁnes the values for D1 to D7 when it is used as an I/O bus Table 125 on page 61

35h

TestBusReg

shows the status of the internal test bus

Table 127 on page 62

36h

AutoTestReg

controls the digital self test

Table 129 on page 62

37h

VersionReg

shows the software version

Table 131 on page 63

38h

AnalogTestReg

controls the pins AUX1 and AUX2

Table 133 on page 63

39h

TestDAC1Reg

deﬁnes the test value for TestDAC1

Table 135 on page 65

3Ah

TestDAC2Reg

deﬁnes the test value for TestDAC2

Table 137 on page 65

3Bh

TestADCReg

shows the value of ADC I and Q channels

Table 139 on page 65

3Ch to 3Fh Reserved

reserved for production tests

Table 141 to Table 147

on page 66

Table 20.

MFRC522 register overview …continued

Address

(hex)

Function

Refer to

MFRC522 数据表(PDF) 35 Page - NXP Semiconductors

MFRC522 数据表(HTML) 35 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96

数据表下载

链接网址

MFRC522 数据表(PDF) 35 Page - NXP Semiconductors

MFRC522 数据表(HTML) 35 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96

数据表 下载

链接网址

数据表下载